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STM32H562II Datasheet(PDF) 211 Page - STMicroelectronics |
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STM32H562II Datasheet(HTML) 211 Page - STMicroelectronics |
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211 / 270 page ![]() DS14258 Rev 5 211/270 STM32H562xx and STM32H563xx Electrical characteristics 238 tSETTLING Settling time (full scale: for a 12-bit code transition between the lowest and the highest input codes when DAC_OUT reaches the final value of ±0.5LSB, ±1LSB, ±2LSB, ±4LSB, ±8LSB) Normal mode, DAC output buffer ON, CL ≤ 50 pF, RL ≥ 5 kΩ ±0.5 LSB - 2.05 3 µs ±1 LSB - 1.97 2.87 ±2 LSB - 1.67 2.84 ±4 LSB - 1.66 2.78 ±8 LSB - 1.65 2.7 Normal mode, DAC output buffer OFF, ±1LSB CL= 10 pF -1.7 2 tWAKEUP (2) Wake-up time from off state (setting the ENx bit in the DAC control register) until the final value of ±1LSB is reached Normal mode, DAC output buffer ON, CL ≤ 50 pF, RL = 5 kΩ -5 7.5 µs Normal mode, DAC output buffer OFF, CL ≤ 10 pF -2 5 PSRR DC VDDA supply rejection ratio Normal mode, DAC output buffer ON, CL ≤ 50 pF, RL = 5 kΩ --80 -28 dB tSAMP Sampling time in Sample and Hold mode, CL= 100 nF (code transition between the lowest and the highest input code when DAC_OUT reaches the ±1LSB final value) MODE<2:0>_V12 = 100/101 (BUFFER ON) -0.7 2.6 ms MODE<2:0>_V12 = 110 (BUFFER OFF) - 11.5 18.7 MODE<2:0>_V12=111(3) (INTERNAL BUFFER OFF) -0.3 0.6 µs Ileak Output leakage current - - - (4) nA CIint Internal sample and hold capacitor - 1.8 2.2 2.6 pF tTRIM Middle code offset trim time Minimum time to verify each code 50 - - µs Voffset Middle code offset for 1 trim code step VREF+ = 3.6 V - 850 - µV VREF+ = 1.8 V - 425 - IDDA(DAC) DAC quiescent consumption from VDDA DAC output buffer ON No load, middle code (0x800) -360 - µA No load, worst code (0xF1C) -490 - DAC output buffer OFF No load, middle/ worst code (0x800) -20 - Sample and Hold mode, CSH = 100 nF - 360*TON/ (TON+TOFF)(5) - Table 98. DAC characteristics(1) (continued) Symbol Parameter Conditions Min Typ Max Unit |
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