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STM32H562II Datasheet(PDF) 208 Page - STMicroelectronics

Part # STM32H562II
Description  Arm® Cortex®-M33 32-bit MCU TrustZone® FPU, 375 DMIPS, 250 MHz, 2-Mbyte flash, 640-Kbyte RAM, math accelerators
PDF  270 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STM32H562II Datasheet(HTML) 208 Page - STMicroelectronics

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Electrical characteristics
STM32H562xx and STM32H563xx
208/270
DS14258 Rev 5
Note:
ADC accuracy vs. negative injection current: injecting a negative current on any analog
input pins should be avoided as this significantly reduces the accuracy of the conversion
being performed on another analog input. It is recommended to add a Schottky diode (pin to
ground) to analog pins, which may potentially inject negative currents.
Figure 56. ADC accuracy characteristics
1. Example of an actual transfer curve.
2. Ideal transfer curve.
3. End point correlation line.
4. ET = Total unadjusted error: maximum deviation between the actual and the ideal transfer curves.
5. EO = Offset error: deviation between the first actual transition and the first ideal one.
6. EG = Gain error: deviation between the last ideal transition and the last actual one.
7. ED = Differential linearity error: maximum deviation between actual steps and the ideal one.
8. EL = Integral linearity error: maximum deviation between any actual transition and the end point correlation
line.
Figure 57. Typical connection diagram when using the ADC with FT/TT pins
featuring analog switch function
1. Refer to Table 95 for the values of RAIN, and CADC.
2. Cparasitic represents the capacitance of the PCB (dependent on soldering and PCB layout quality) plus the
MSv19880V6
(1) Example of an actual transfer curve
(2) Ideal transfer curve
(3) End-point correlation line
n = ADC resolution
ET = total unadjusted error: maximum deviation
between the actual and ideal transfer curves
EO = offset error: maximum deviation between the first
actual transition and the first ideal one
EG = gain error: deviation between the last ideal
transition and the last actual one
ED = differential linearity error: maximum deviation
between actual steps and the ideal one
EL = integral linearity error: maximum deviation between
any actual transition and the end point correlation line
2
n-1
7
6
5
4
3
2
1
0
Output code
EO
VSSA
2
n-2
2
n-3
VREF+ (VDDA)
ET
EL
ED
1 LSB ideal
EG
(1)
(2)
(3)
(or
)]
[1LSB =
VDDA
2
n
VREF+
2
n
MSv67871V3
Sample-and-hold ADC converter
Converter
Cparasitic
(2)
Ilkg
(3)
CADC
VDDA
(4)
RAIN
(1)
VAIN
RADC
VREF+
(4)
VSSA
I/O
analog
switch
Sampling
switch with
multiplexing
VSS
VSS



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