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STM32H562II Datasheet(PDF) 195 Page - STMicroelectronics |
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STM32H562II Datasheet(HTML) 195 Page - STMicroelectronics |
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195 / 270 page ![]() DS14258 Rev 5 195/270 STM32H562xx and STM32H563xx Electrical characteristics 238 5.3.19 Octo-SPI interface characteristics Unless otherwise specified, the parameters given in Table 88 and Table 89 are derived from tests performed under the ambient temperature, fHCLK frequency and VDD supply voltage conditions summarized in Table 20, with the following configuration: • Output speed is set to OSPEEDRy[1:0] = 11 • Measurement points are done at CMOS levels: 0.5 VDD • I/O compensation cell activated • HSLV activated when VDD ≤ 2.7 V • VOS level set to VOS0 Refer to Section 5.3.15 for more details on the input/output alternate function characteristics. Figure 47. OCTOSPI SDR read/write timing diagram Table 88. OCTOSPI characteristics in SDR mode(1)(2) Symbol Parameter Conditions Min Typ Max(3) Unit F(CLK) Clock frequency 1.71 V < VDD < 1.9 V, CL = 15 pF -- 110 MHz 1.71 V < VDD < 3.6 V, CL =15 pF -- 150 tw(CLKH) Clock high and low time, even division PRESCALER[7:0] = n (= 0, 1, 3, 5,..., 255) t(CLK) / 2 - 0.5 - t(CLK) / 2 + 0.5 ns tw(CLKL) t(CLK) / 2 - 0.5 - t(CK) / 2 + 0.5 tw(CLKH) Clock high and low time, odd division PRESCALER[7:0] = n (= 2, 4, 6, ..., 254) (n / 2) * t(CLK) / (n + 1) - 0.5 - (n / 2) * t(CLK) / (n + 1) + 0.5 tw(CLKL) (n / 2 + 1) * t(CLK) / (n + 1) - 0.5 - (n / 2 + 1) * t(CLK) / (n + 1) + 0.5 ts(IN) Data input setup time - 4 - - th(IN) Data input hold time - 1 - - tv(OUT) Data output valid time - - 0.5 1 th(OUT) Data output hold time - 0 - - 1. All values apply to Octal- and Quad-SPI mode. 2. Evaluated by characterization - Not tested in production. 3. At VOS1 these values are degraded by up to 5%. MSv36878V3 Data output D0 D1 D2 Clock Data input D0 D1 D2 t(CLK) tw(CLKH) tw(CLKL) tr(CLK) tf(CLK) ts(IN) th(IN) tv(OUT) th(OUT) |
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