PCINT13 datasheet(24/294 Pages) ATMEL

24 / 294 page

9219A–RFID–01/11

Atmel ATA5505 [Preliminary]

The next code examples show assembly and C functions for reading the EEPROM. The

examples assume that interrupts are controlled so that no interrupts will occur during execu-

tion of these functions.

3.3.6

Preventing EEPROM Corruption

During periods of low V

CC, the EEPROM data can be corrupted because the supply voltage is

too low for the CPU and the EEPROM to operate properly. These issues are the same as for

board level systems using EEPROM, and the same design solutions should be applied.

An EEPROM data corruption can be caused by two situations when the voltage is too low.

First, a regular write sequence to the EEPROM requires a minimum voltage to operate cor-

rectly. Secondly, the CPU itself can execute instructions incorrectly, if the supply voltage is too

low.

EEPROM data corruption can easily be avoided by following this design recommendation:

Assembly Code Example

EEPROM_read:

; Wait for completion of previous write

sbic

EECR,EEPE

rjmp

EEPROM_read

; Set up address (r18:r17) in address register

out

EEARH, r18

out

EEARL, r17

; Start eeprom read by writing EERE

sbi

EECR,EERE

; Read data from data register

r16,EEDR

ret

C Code Example

unsigned char

EEPROM_read(unsigned char ucAddress)

{

/* Wait for completion of previous write */

while(EECR & (1<<EEPE))

;

/* Set up address register */

EEAR = ucAddress;

/* Start eeprom read by writing EERE */

EECR |= (1<<EERE);

/* Return data from data register */

return EEDR;

}

PCINT13 Datasheet(PDF) 24 Page - ATMEL Corporation

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