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AM7968-125JC Datasheet(PDF) 16 Page - Advanced Micro Devices |
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AM7968-125JC Datasheet(HTML) 16 Page - Advanced Micro Devices |
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16 / 127 page ![]() AMD 12 Am7968/Am7969 of the internal byte clock (CLK) and the rising edge of strobe does not violate tBB specification shown in the SWITCHING CHARACTERISTICS Section. The internal byte clock controls the flow of data from the input register through the shift register. The falling edge of the internal byte clock delineates the end of one byte from the start of the next. Due to various tolerances in the PLL, the period of the internal byte clock may vary slightly. This effect may cause a shift in the location of the byte boundary with respect to the falling edge of the clock. This variation may move the byte boundary and therefore creates a window during which the part should not be strobed. This window called the t6 window, is shown in the figure below. If the part is strobed during the t6 window data will not be lost however, a sync may be added and the transmitter latency will be increased by one byte time. CLK –9/8(t1/n) + 9 ns 20 ns Strobe Stayout Area (t6 window) 07370F-9 Nominal Byte Boundary Sync Acquisition In case of errors which cause Am7969 Receivers to lose byte/symbol sync, and on power-up, internal logic de- tects this loss-re-acquisition of sync and modifies the CLK output. CLK output is actually a buffered version of the signal which controls Data transfers inside the Am7969 Receiver on byte boundaries. Byte boundaries move when the Am7969 Receiver loses, and re- acquires sync. To protect slave systems (which may use this output as a clock synchronous with the incoming data) from having clocks which are too narrow, the out- put logic will stretch an output pulse when the pulse would have been less than a byte-time long. The data being processed just prior to this re-acquisition of sync will be lost. The Sync symbol, and all subsequent data will be processed correctly. TAXI User Test Modes TLS input can be used to force the Am7968 Transmitter into either of the two Test modes. If TLS is open or termi- nated to approximately VCC/2 (Test Mode 2), the internal VCO is switched out and everything is clocked directly from the CLK input. The serial output data rate will be at the CLK bit rate and not at 10X, 11X, or 12X, as is the case in normal operation. Test Mode 2 will allow testing of the logic in the Latches, Encoder, and Shifter without having to first stabilize the PLL clock multiplier. In Test Mode 1 ( TLS wired to VCC), the PLL is enabled and the chip operates normally, except that the output is an NRZ stream (CLK is an input & ACK function is slightly modi- fied). This will allow testing of all functions at full rate without needing to perform match loop tests to accom- modate the data inversion characteristics of NRZI. Differential SERIN+/SERIN– inputs can be used to force the Am7969 Receiver into its Test mode. This will allow testing of the logic in the Latches, Decoder, and Shifter without having to first stabilize the the PLL. If SERIN– is tied to ground, the internal VCO is switched out and X1 becomes the internal bit rate clock. The serial data rate will be at the CLK bit rate, not at 10X, 11X, or 12X, as is the case in normal operation. In this mode, SERIN+ becomes a single-ended serial data input with nominal 100K ECL threshold voltages (Referenced to +5 volts). These Test Mode switches make the parts determinate, synchronous systems, instead of statistical, asynchro- nous ones. An automatic test system will be able to clock each part through the functional test patterns at any rate or sequence that is convenient. After the logic has been verified, the part can be put back into the nor- mal mode, and the PLL functions verified knowing that the rest of the chip is functional. |
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