External Inspection

External inspection of ICs can be completed with a single Sensor. The position

offset of the entire pallet before inspection can be adjusted on the image itself,

which reduces the amount of work required to increase mechanical positioning

accuracy.

Measurement Flow

Purpose

Compensates for the position

offset of the chip.

Chip position

offset

on

lf,

Measurement Flow

ng

Image Filters

Position compensation

Component Positioning

The Sensor can measure angles of rotation and other position information, so

it can also be used for positioning. Inspections can also be performed for the

number and size of holes along with the position information.

r the

Adjusts the image so that

it is easier to inspect

Compen

offset o

Position compensation

P iti

ti

Inspections

Calculations and Outputs

Calculation

Data Output

Individual Judgement Output

Measurement Flow

number and size of holes along wit

Measurement Flow

Image Filters

Adjusts the image so that

it is easier to inspect

Image Filters

I

Filt

Adjusts t

it is easie

Inspections and Measurements

Calculations and Outputs

Calculation

Data Output

Calculates data for external output.

Outputs the position information and incline.

Purpose

Extended Functions : Image Inspections

Width

measurements

Foreign matter

Number of pins

Pitch

inspections

Incomplete

characters

Edge Count

Sensitive Search

Color Data

Edge Position

Number of pins and pitch

inspections

Incomplete characters

Foreign matter

Width measurements

Uses the inspection data for

calculations and judgements.

Outputs the measurement

values.

Outputs the judgements of

inspections

to individually.

Shape Search III

Labeling

Component incline and position

Number of holes and hole sizes

Number and Sizes of Holes

Inclination

You can combine multiple inspection items to perform external inspections, positioning, and other tasks all from a single Sensor.

Easily Perform Both Inspection and Positioning

6