Table 15. DC characteristics (M24512-R device grade 6)

Symbol

Parameter

Test conditions (1)(in addition to those in Table 8)

Min.

Max.

Unit

ILI

Input leakage current

( E0, E1, E2, SCL, SDA)

VIN = VSS or VCC, device in Standby mode

-

± 2

µA

ILO

Output leakage current

SDA in Hi-Z, external voltage applied on SDA: VSS or

VCC

-

± 2

µA

ICC

Supply current (Read)

VCC = 1.8 V, fc= 400 kHz

-

0.8

mA

fc= 1 MHz

-

2.5

mA

ICC0

Supply current (Write)

During tW

1.8 V ≤ VCC ≤ 2.5 V

-

5(2)

mA

ICC1

Standby supply current

Device not selected,(3)

VIN = VSS or VCC, VCC = 1.8 V

-

1

µA

VIL

Input low voltage (SCL, SDA,

WC,E2, E1, E0)(4)

1.8 V ≤ VCC < 2.5 V

-0.45

0.25 VCC

V

VIH

Input high voltage

(SCL, SDA)

1.8 V ≤ VCC < 2.5 V

0.75 VCC

6.5

V

Input high voltage

(WC, E2, E1, E0)(5)

1.8 V ≤ VCC < 2.5 V

0.75 VCC VCC+0.6

V

VOL

Output low voltage

IOL = 1 mA, VCC = 1.8 V

-

0.2

V

1. If the application uses the voltage range R device with 2.5 V < Vcc < 5.5 V and -40 °C < TA < +85 °C, please refer to

Table 14 instead of this table.

2. Characterized value, not tested in production.

3. The device is not selected after power-up, after a read instruction (after the stop condition), or after the completion of the

internal write cycle tW (tW is triggered by the correct decoding of a write instruction).

4. Ei inputs should be tied to VSS (see Section 2.3 Chip enable (E2, E1, E0)).

5. Ei inputs should be tied to VCC (see Section 2.3 Chip enable (E2, E1, E0)

M24512-W M24512-R M24512-DF

DC and AC parameters

DS6520 - Rev 31

page 23/47