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IS25LP256D-RLLA3 Datasheet(PDF) 167 Page - Integrated Silicon Solution, Inc |
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IS25LP256D-RLLA3 Datasheet(HTML) 167 Page - Integrated Silicon Solution, Inc |
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167 / 174 page ![]() IS25LP256D IS25WP256D Integrated Silicon Solution, Inc.- www.issi.com 167 Rev A6 04/15/2019 9.9 PROGRAM/ERASE PERFORMANCE Parameter Typ Max Unit Sector Erase Time (4Kbyte) 100 300 ms Block Erase Time (32Kbyte) 0.14 0.5 s Block Erase Time (64Kbyte) 0.17 1.0 s Chip Erase Time 70 180 s Page Programming Time 0.2 0.8 ms Byte Program 8 40 µs Note: These parameters are characterized and not 100% tested. 9.10 RELIABILITY CHARACTERISTICS Parameter Min Unit Test Method Endurance 100,000 Cycles JEDEC Standard A117 Data Retention 20 Years JEDEC Standard A103 ESD – Human Body Model 2,000 Volts JEDEC Standard A114 ESD – Machine Model 200 Volts JEDEC Standard A115 Latch-Up 100 + ICC1 mA JEDEC Standard 78 Note: These parameters are characterized and not 100% tested. |
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