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ADRF6655ACPZ-R7 Datasheet(PDF) 34 Page - Analog Devices |
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ADRF6655ACPZ-R7 Datasheet(HTML) 34 Page - Analog Devices |
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34 / 44 page ![]() ADRF6655 Rev. 0 | Page 34 of 44 CHARACTERIZATION SETUPS Figure 78 to Figure 80 show the general characterization bench setups used extensively for the ADRF6655. The setup shown in Figure 78 was used to do the bulk of the testing. An automated Agilent VEE program was used to control the equipment over the IEEE bus. This setup was used to measure gain, IP1dB, OP1dB, IIP2, IIP3, OIP2, OIP3, LO-to-IF and LO-to-RF leakage, LO amplitude, and supply current. The ADRF6655 was characterized on an upconversion and downconversion evaluation board configured for each conversion as described in the Input Matching section and the Output Matching and Biasing section. For all measurements of the ADRF6655, the loss of the RF input balun was de-embedded. To do phase noise and reference spurs measurements, see the phase noise setup used in Figure 79. Phase noise measurements were done on a downconversion board looking at the output at different offsets. Figure 80 shows the setup used to make the noise figure measurements with no blocker present, and Figure 81 shows the setup for making the noise figure measurements under blocking conditions. Note that attention must be given to the measurement setup. The RF blocker signal must be filtered through a band-pass filter to prevent noise (which increases when output power is increased) from contributing at the desired RF frequency. At least 30 dB attenuation is needed at the desired RF and image frequencies. For example, to generate a blocker signal at the IF output of 205 MHz, the blocker signal generator is set at 995 MHz, and the part is programmed to generate a LO frequency of 1200 MHz that results in an output signal of 205 MHz. This signal must be filtered out through a band reject filter on the output so that the noise figure can be measured at 200 MHz, which corresponds to the output frequency for LO = 1200 MHz and RF input = 1000 MHz. |
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