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MPC8378EVRALDA Datasheet(PDF) 87 Page - Freescale Semiconductor, Inc |
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MPC8378EVRALDA Datasheet(HTML) 87 Page - Freescale Semiconductor, Inc |
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87 / 126 page ![]() MPC8378E PowerQUICC™ II Pro Processor Hardware Specifications, Rev. 2 Freescale Semiconductor 87 High-Speed Serial Interfaces (HSSI) Figure 63. Differential Measurement Points for Rise and Fall Time Figure 64. Single-Ended Measurement Points for Rise and Fall Time Matching Rising edge rate (SD n_REF_CLK) to falling edge rate (SD n_REF_CLK) matching Rise-Fall Matching — 20 % 1, 4 Note: 1 Measurement taken from single ended waveform. 2 Measurement taken from differential waveform. 3 Measured from –200 mV to +200 mV on the differential waveform (derived from SDn_REF_CLK minus SDn_REF_CLK). The signal must be monotonic through the measurement region for rise and fall time. The 400 mV measurement window is centered on the differential zero crossing. See Figure 63. 4 Matching applies to rising edge rate for SDn_REF_CLK and falling edge rate for SDn_REF_CLK. It is measured using a 200 mV window centered on the median cross point where SDn_REF_CLK rising meets SD n_REF_CLK falling. The median cross point is used to calculate the voltage thresholds the oscilloscope is to use for the edge rate calculations. The Rise Edge Rate of SD n_REF_CLK should be compared to the Fall Edge Rate of SDn_REF_CLK, the maximum allowed difference should not exceed 20% of the slowest edge rate. See Figure 64. Table 66. SerDes Reference Clock Common AC Parameters (continued) At recommended operating conditions with XVDD_SRDS or XVDD_SRDS = 1.0 V ± 5%. Parameter Symbol Min Max Unit Notes VIH = +200 mV 0.0 V VIL = –200 mV SD n_REF_CLK Minus SD n_REF_CLK Rise Edge Rate Fall Edge Rate TFALL TRISE SD n_REF_CLK VCROSS MEDIAN SD n_REF_CLK SD n_REF_CLK VCROSS MEDIAN SD n_REF_CLK VCROSS MEDIAN –100 mV VCROSS MEDIAN +100 mV |
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