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MPC8349CVVALDB Datasheet(PDF) 16 Page - Freescale Semiconductor, Inc |
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MPC8349CVVALDB Datasheet(HTML) 16 Page - Freescale Semiconductor, Inc |
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16 / 87 page ![]() MPC8349EA PowerQUICC II Pro Integrated Host Processor Hardware Specifications, Rev. 13 16 Freescale Semiconductor DDR and DDR2 SDRAM Table 13 provides the DDR2 capacitance when GVDD(typ) = 1.8 V. Table 14 provides the recommended operating conditions for the DDR SDRAM component(s) when GVDD(typ) = 2.5 V. Output low current (VOUT = 0.280 V) IOL 13.4 — mA — Notes: 1. GVDD is expected to be within 50 mV of the DRAM GVDD at all times. 2. MVREF is expected to equal 0.5 × GVDD, and to track GVDD DC variations as measured at the receiver. Peak-to-peak noise on MVREF cannot exceed ±2% of the DC value. 3. VTT is not applied directly to the device. It is the supply to which far end signal termination is made and is expected to equal MVREF. This rail should track variations in the DC level of MVREF. 4. Output leakage is measured with all outputs disabled, 0 V ≤ V OUT ≤ GVDD. Table 13. DDR2 SDRAM Capacitance for GVDD(typ) = 1.8 V Parameter/Condition Symbol Min Max Unit Notes Input/output capacitance: DQ, DQS, DQS CIO 68 pF 1 Delta input/output capacitance: DQ, DQS, DQS CDIO —0.5 pF 1 Note: 1. This parameter is sampled. GVDD = 1.8 V ± 0.090 V, f = 1 MHz, TA = 25°C, VOUT = GVDD/2, VOUT (peak-to-peak) = 0.2 V. Table 14. DDR SDRAM DC Electrical Characteristics for GVDD(typ) = 2.5 V Parameter/Condition Symbol Min Max Unit Notes I/O supply voltage GVDD 2.375 2.625 V 1 I/O reference voltage MVREF 0.49 × GV DD 0.51 × GV DD V2 I/O termination voltage VTT MVREF –0.04 MVREF +0.04 V 3 Input high voltage VIH MVREF +0.18 GVDD +0.3 V — Input low voltage VIL –0.3 MVREF –0.18 V — Output leakage current IOZ –9.9 –9.9 μA4 Output high current (VOUT = 1.95 V) IOH –15.2 — mA — Output low current (VOUT = 0.35 V) IOL 15.2 — mA — Notes: 1. GVDD is expected to be within 50 mV of the DRAM GVDD at all times. 2. MVREF is expected to be equal to 0.5 × GVDD, and to track GVDD DC variations as measured at the receiver. Peak-to-peak noise on MVREF may not exceed ±2% of the DC value. 3. VTT is not applied directly to the device. It is the supply to which far end signal termination is made and is expected to be equal to MVREF. This rail should track variations in the DC level of MVREF. 4. Output leakage is measured with all outputs disabled, 0 V ≤ V OUT ≤ GVDD. Table 12. DDR2 SDRAM DC Electrical Characteristics for GVDD(typ) = 1.8 V (continued) |
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