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STTH3R04Q Datasheet(PDF) 3 Page - STMicroelectronics

Part # STTH3R04Q
Description  Ultrafast recovery diode
PDF  10 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STTH3R04Q Datasheet(HTML) 3 Page - STMicroelectronics

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STTH3R04
Characteristics
3/10
Table 5.
Dynamic characteristics (Tj = 25 °C unless otherwise stated)
Symbol
Parameter
Test conditions
Min
Typ
Max
Unit
trr
Reverse recovery time
IF = 1 A, dIF/dt = -50 A/µs,
VR = 30 V, Tj = 25 °C
35
ns
IF = 1 A, dIF/dt = -100 A/µs,
VR = 30 V, Tj = 25 °C
18
25
IRM
Reverse recovery current
IF = 3.0 A, dIF/dt = -200 A/µs,
VR = 320 V, Tj = 125 °C
45.5
A
tfr
Forward recovery time
IF = 3.0 A
dIF/dt = 100 A/µs
VFR = 1.1 x VFmax, Tj = 25 °C
75
ns
VFP
Forward recovery voltage
IF = 3.0 A
dIF/dt = 100 A/µs
2.5
V
Figure 1.
Conduction losses versus
average forward current
Figure 2.
Forward voltage drop versus
forward current
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
P(W)
δ=0.05
δ=0.1
δ=0.2
δ=0.5
δ=1
T
δ=tp/T
tp
IF(AV)(A)
0
5
10
15
20
25
30
35
40
45
50
0.0
0.4
0.8
1.2
1.6
2.0
2.4
2.8
3.2
I
FM(A)
T
J=150°C
(Maximum values)
T
J=150°C
(Maximum values)
T
J=150°C
(Typical values)
T
J=150°C
(Typical values)
T
J=25°C
(Maximum values)
T
J=25°C
(Maximum values)
VFM(V)
Figure 3.
Relative variation of thermal
impedance junction to lead versus
pulse duration, DO-15 (epoxy FR4,
copper thickness = 35 µm)
Figure 4.
Relative variation of thermal
impedance junction to ambient
versus pulse duration, DO-201AD
(epoxy FR4, copper
thickness = 35 µm)
0.0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
1.E-01
1.E+00
1.E+01
1.E+02
1.E+03
Z
th(j-l)/Rth(j-l)
Single pulse
DO-15
Lleads=10mm
tP(s)
0.0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
1.E-01
1.E+00
1.E+01
1.E+02
1.E+03
Z
th(j-a)/Rth(j-a)
Single pulse
DO-201AD
Lleads=10mm
tP(s)



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