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STM32F091VCU6TP Datasheet(PDF) 87 Page - STMicroelectronics

Part # STM32F091VCU6TP
Description  ARM®-based 32-bit MCU, up to 256 KB Flash, CAN, 12 timers, ADC, DAC, and comm. interfaces, 2.0 - 3.6V
PDF  128 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STM32F091VCU6TP Datasheet(HTML) 87 Page - STMicroelectronics

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DocID026284 Rev 4
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STM32F091xB STM32F091xC
Electrical characteristics
99
Equation 1: RAIN max formula
The formula above (Equation 1) is used to determine the maximum external impedance
allowed for an error below 1/4 of LSB. Here N = 12 (from 12-bit resolution).
RAIN
TS
fADC CADC
2
N2
+
()
ln
×
×
----------------------------------------------------------------
RADC
–
<
Table 58. RAIN max for fADC = 14 MHz
Ts (cycles)
tS (µs)
RAIN max (kΩ)
(1)
1.5
0.11
0.4
7.5
0.54
5.9
13.5
0.96
11.4
28.52.0425.2
41.52.9637.2
55.5
3.96
50
71.5
5.11
NA
239.5
17.1
NA
1. Guaranteed by design, not tested in production.
Table 59. ADC accuracy(1)(2)(3)
Symbol
Parameter
Test conditions
Typ
Max(4)
Unit
ET
Total unadjusted error
fPCLK = 48 MHz,
fADC = 14 MHz, RAIN < 10 kΩ
VDDA = 3 V to 3.6 V
TA = 25 °C
±1.3
±2
LSB
EO
Offset error
±1
±1.5
EG
Gain error
±0.5
±1.5
ED
Differential linearity error
±0.7
±1
EL
Integral linearity error
±0.8
±1.5
ET
Total unadjusted error
fPCLK = 48 MHz,
fADC = 14 MHz, RAIN < 10 kΩ
VDDA = 2.7 V to 3.6 V
TA = - 40 to 105 °C
±3.3
±4
LSB
EO
Offset error
±1.9
±2.8
EG
Gain error
±2.8
±3
ED
Differential linearity error
±0.7
±1.3
EL
Integral linearity error
±1.2
±1.7
ET
Total unadjusted error
fPCLK = 48 MHz,
fADC = 14 MHz, RAIN < 10 kΩ
VDDA = 2.4 V to 3.6 V
TA = 25 °C
±3.3
±4
LSB
EO
Offset error
±1.9
±2.8
EG
Gain error
±2.8
±3
ED
Differential linearity error
±0.7
±1.3
EL
Integral linearity error
±1.2
±1.7
1. ADC DC accuracy values are measured after internal calibration.



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