If Military/Aerospace specified devices are required,

please contact the National Semiconductor Sales Office/

Distributors for availability and specifications.

Supply Voltage

36 V

Differential Input Voltage

DC

Input Voltage

−0.3 V

Power Dissipation (Note 2)

Molded DIP

570 mW

Output Short Circuit to GND (Note 3)

Continuous

Input Current V

50 mA

Operating Temperature Range

0˚C to +70˚C

Storage Temperature Range

−65˚ to +150˚C

Soldering Information:

Dual-In-Line Package (10 sec.)

+260˚C

S.O. Package:

Vapor Phase (60 sec.)

+215˚C

Infrared (15 sec.)

+220˚C

See AN-450 “Surface Mounting Methods and Their Effect on

Product Reliability” for other methods of soldering surface

mount devices.

Electrical Characteristics

(V+=5V

Parameter

Conditions

Min

Typ

Max

Units

Input Offset Voltage

T

DC

Input Bias Current

I

2.5

25

nA

DC

Output in the Linear Range, T

Input Offset Current

I

DC

Input Common

T

0

V+−1.5

V

DC

Mode Voltage Range

Supply Current

R

60

100

µA

DC

Voltage Gain

V

500

V/mV

R

Large Signal

V

1.3

µSec

Response Time

V

Response Time

V

8

µSec

Output Sink Current

V

30

mA

DC

T

V

0.20

0.70

mA

DC

Output Leakage Current

V

0.1

nA

DC

Input Offset Voltage

(Note 10)

DC

Input Offset Current

I

nA

DC

Input Bias Current

I

4

40

nA

DC

Input Common

Single Supply

0

V+−2.0

V

DC

Mode Voltage Range

Output Sink Current

V

10

mA

DC

Output Leakage Current

V

1.0

µA

DC

Differential Input Voltage

All V

36

V

DC

Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is func-

tional, but do not guarantee specific performance limits.

either device is soldered in a printed circuit board in a still air environment. The low bias dissipation and the “ON-OFF” characteristic of the outputs keeps the chip

Note 4: This input current will only exist when the voltage at any of the input leads is driven negative. It is due to the collector-base junction of the input PNP tran-

sistors becoming forward biased and thereby acting as input clamp diodes. In addition to this diode action, there is also lateral NPN parasitic transistor action on the

IC chip. This transistor action can cause the output voltage of the comparators to go to the V+ voltage level (or to ground for a large input overdrive) for the time du-

ration that an input is driven negative. This is not destructive and normal output states will re-establish when the input voltage, which is negative, again returns to a

tested. These parameters are not used to calculate outgoing AQL.

Note 6: The direction of the input current is out of the IC due to the PNP input stage. This current is essentially constant, independent of the state of the output, so

no loading change exists on the reference or the input lines as long as the common-mode range is not exceeded.

Note 7: The input common-mode voltage or either input voltage should not be allowed to go negative by more than 0.3V. The upper end of the common-mode volt-

Note 8: The response time specified is for a 100 mV input step with 5 mV overdrive. For larger overdrive signals 1.3 µs can be obtained. See Typical Performance

Characteristics section.

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