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AM29F080B Datasheet(PDF) 23 Page - Advanced Micro Devices |
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AM29F080B Datasheet(HTML) 23 Page - Advanced Micro Devices |
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23 / 37 page ![]() Am29F080B 23 P R E L I M I NARY TEST CONDITIONS Table 7. Test Specifications KEY TO SWITCHING WAVEFORMS 2.7 k Ω CL 6.2 k Ω 5.0 V Device Under Test Note: Diodes are IN3064 or equivalent 21503-13 Figure 8. Test Setup Test Condition -75 All others Unit Output Load 1 TTL gate Output Load Capacitance, CL (including jig capacitance) 30 100 pF Input Rise and Fall Times 5 20 ns Input Pulse Levels 0.0–3.0 0.45–2.4 V Input timing measurement reference levels 1.5 0.8, 2.0 V Output timing measurement reference levels 1.5 0.8, 2.0 V KS000010-PAL WAVEFORM INPUTS OUTPUTS Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) |
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