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MAT01 Datasheet(PDF) 8 Page - Analog Devices |
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MAT01 Datasheet(HTML) 8 Page - Analog Devices |
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8 / 12 page  MAT01 Data Sheet Rev. C | Page 8 of 12 TEST CIRCUITS Figure 11. Matching Measurement Circuit Figure 12. Noise Measurement Circuit +16.5V 50kΩ* 50kΩ* TEST UNITS 20kΩ OP1177 100kΩ 1% 1MΩ 1MΩ* 100kΩ 1% –15V VOUT S1B S1A S1A S1B VOS VOUT1 CLOSED CLOSED IOS VOUT2 – VOUT1 1V PER mV 1V PER nA OPEN OPEN 100pF MAT01 100pF 50kΩ* V– 20µA *MATCHED TO 0.01% +16.5V +15V 50kΩ* 50kΩ* TEST V01/√2 2.5MΩ 4kΩ V02 3.3kΩ LOW FREQUENCY NOISE NOISE DENSITY 4MΩ 4MΩ 100Ω 4.7µF –15V +15V S1B S2 S3 B A S1A S1A S1B V01/(√2 × 4MΩ) OPEN OPEN CLOSED A NOISE VOLTAGE DENSITY (PER TRANSISTOR) NOISE CURRENT DENSITY (PER TRANSISTOR) LOW FREQUENCY NOISE (REFERRED TO INPUT) CLOSED CLOSED CLOSED A OPEN B V02 PEAK-TO-PEAK 25,000 CLOSED CLOSED 2pF MAT01 2pF 50kΩ* –15V 20µA 720kΩ *MATCHED TO 0.01% S2 S3** READING V01 SPECTRUM ANALYZER OR QUAN-TECH IC NOISE ANALYZER 2181/2283 **A AND B REFER TO THE THROW POSITION OF THE SWITCH |
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