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STM32F030F4 Datasheet(PDF) 51 Page - STMicroelectronics |
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STM32F030F4 Datasheet(HTML) 51 Page - STMicroelectronics |
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51 / 88 page ![]() DocID024849 Rev 1 51/88 STM32F030x4 STM32F030x6 STM32F030x8 Electrical characteristics 73 Figure 14. Typical application with an 8 MHz crystal 1. REXT value depends on the crystal characteristics. Low-speed external clock generated from a crystal resonator The low-speed external (LSE) clock can be supplied with a 32.768 kHz crystal resonator oscillator. All the information given in this paragraph are based on design simulation results obtained with typical external components specified in Table 32. In the application, the resonator and the load capacitors have to be placed as close as possible to the oscillator pins in order to minimize output distortion and startup stabilization time. Refer to the crystal resonator manufacturer for more details on the resonator characteristics (frequency, package, accuracy). MS19876V1 OSC_OU T OSC_IN fHSE CL1 RF 8 MH z resonator REXT(1) CL2 Resonator with integrated capacitors Bias controlled gain Table 32. LSE oscillator characteristics (fLSE = 32.768 kHz) Symbol Parameter Conditions(1) Min(2) Typ Max(2) Unit IDD LSE current consumption LSEDRV[1:0]=00 lower driving capability -0.5 - µA LSEDRV[1:0]= 01 medium low driving capability -0.8 - LSEDRV[1:0] = 10 medium high driving capability -1.1 - LSEDRV[1:0]=11 higher driving capability -1.4 - gm Oscillator transconductance LSEDRV[1:0]=00 lower driving capability 5- - µA/V LSEDRV[1:0]= 01 medium low driving capability 8- - LSEDRV[1:0] = 10 medium high driving capability 15 - - LSEDRV[1:0]=11 higher driving capability 25 - - tSU(LSE) (3) Startup time VDD is stabilized - 2 - s 1. Refer to the note and caution paragraphs below the table, and to the application note AN2867 “Oscillator design guide for ST microcontrollers”. 2. Guaranteed by design, not tested in production. 3. tSU(LSE) is the startup time measured from the moment it is enabled (by software) to a stabilized 32.768 kHz oscillation is reached. This value is measured for a standard crystal and it can vary significantly with the crystal manufacturer |
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