TLV702xx

SLVSAG6B

– SEPTEMBER 2010 – REVISED FEBRUARY 2011

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

PRODUCT

(2)

TLV702xx(x)Pyyyz

XX(X) is the nominal output voltage. For output voltages with a resolution of 100 mV, two digits are used in

the ordering number; otherwise, three digits are used (for example, 28 = 2.8 V; 475 = 4.75 V).

P is optional; devices with P have an LDO regulator with an active output discharge.

YYY is the package designator.

Z is package quantity. Use "R" for reel (3000 pieces), and "T" for tape (250 pieces).

(1)

For the most current package and ordering information see the Package Option Addendum at the end of this document, or visit the

device product folder at www.ti.com.

(2)

Output voltages from 1.2 V to 4.8 V in 50-mV increments are available. Contact factory for details and availability.

ABSOLUTE MAXIMUM RATINGS

over operating free-air temperature range (unless otherwise noted)

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VALUE

UNIT

MIN

MAX

IN

–0.3

+6.0

V

EN

–0.3

+6.0

V

OUT

–0.3

+6.0

V

Current (source)

OUT

Internally Limited

Output short-circuit duration

Indefinite

–55

+150

°C

Temperature

–55

+150

°C

Human Body Model (HBM) QSS 009-105 (JESD22-A114A)

2

kV

Charge Device Model (CDM) QSS 009-147

500

V

(JESD22-C101B.01)

(1)

Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating

conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods my affect device reliability.

(2)

All voltages are with respect to network ground terminal.

(3)

ESD testing is performed according to the respective JESD22 JEDEC standard.

DISSIPATION RATINGS

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PACKAGE

DBV

200

°C/W

500mW

275mW

200mW

DSE

180

°C/W

555mW

305mW

222mW

(1)

For board details, see the Thermal Information section.

2

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