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AD834JRZ-R7 Datasheet(PDF) 10 Page - Analog Devices |
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AD834JRZ-R7 Datasheet(HTML) 10 Page - Analog Devices |
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10 / 20 page ![]() AD834 Data Sheet Rev. F | Page 10 of 20 EXPLANATION OF TYPICAL PERFORMANCE CHARACTERISTICS AND TEST CIRCUITS Figure 4 is a plot of the mean-square output vs. frequency for the test circuit of Figure 8. Note that the rising response is due to package resonances. For frequencies above 1 MHz, ac feedthrough is dominated by static nonlinearities in the transfer function and the finite offset voltages. The offset voltages cause a small fraction of the funda- mental to appear at the output, and can be nulled out (see Figure 5). THD data represented in Figure 6 is dominated by the second harmonic, and is generated with 0 dBm input on the ac input and 1 V on the dc input. For a given amplitude on the ac input, THD is relatively insensitive to changes in the dc input ampli- tude. Varying the ac input amplitude while maintaining a constant dc input amplitude affects THD performance. The squarer configuration shown in Figure 8 is used to determine wideband performance because it eliminates the need for (and the response uncertainties of) a wideband measurement device at the output. The wideband output of a squarer configuration is a fluctuating current at twice the input frequency with a mean value proportional to the square of the input amplitude. By placing the capacitors, C3/C5 and C4/C6, across the load resistors, R1 and R2, a simple low-pass filter is formed, and the mean-square value is extracted. The mean-square response can be measured using a DVM connected across R1 and R2. Care should be taken when laying out the board. When using the DIP package, mount the IC socket on a ground plane with a clear area in the rectangle formed by the pins. This is important because significant transformer action can arise if the pins pass through individual holes in the board; improperly constructed test jigs have caused oscillation at 1.3 GHz. |
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