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FEATURES

D OR PW PACKAGE

(TOP VIEW)

1

2

3

4

5

6

7

14

13

12

11

10

9

8

1A

1B

1Y

2A

2B

2Y

GND

4B

4A

4Y

3B

3A

3Y

DESCRIPTION/ORDERING INFORMATION

SN74LVC86A-EP

QUADRUPLE 2-INPUT EXCLUSIVE-OR GATE

SCAS752B – DECEMBER 2003 – REVISED JULY 2007

• Controlled Baseline

• Max t

–

One Assembly/Test Site, One Fabrication

• Typical V

Site

• Extended Temperature Performance of –40°C

• Typical V

to 125

°C and –55°C to 125°C

• Enhanced Diminishing Manufacturing Sources

(DMS) Support

• Enhanced Product-Change Notification

• Operates From 2 V to 3.6 V

• Inputs Accept Voltages to 5.5 V

(1)

Component qualification in accordance with JEDEC and

industry standards to ensure reliable operation over an

extended temperature range. This includes, but is not limited

to, Highly Accelerated Stress Test (HAST) or biased 85/85,

temperature cycle, autoclave or unbiased HAST,

electromigration, bond intermetallic life, and mold compound

life. Such qualification testing should not be viewed as

justifying use of this component beyond specified

performance and environmental limits.

The device performs the Boolean function Y = A

⊕ B or Y = AB + AB in positive logic.

A common application is as a true/complement element. If one of the inputs is low, the other input is reproduced

in true form at the output. If one of the inputs is high, the signal on the other input is reproduced inverted at the

output.

Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of this device as a translator in

a mixed 3.3-V/5-V system environment.

ORDERABLE PART NUMBER

TOP-SIDE MARKING

SOIC – D

Reel of 2500

SN74LVC86AQDREP

LVC86AE

–40

°C to 125°C

TSSOP – PW

Reel of 2000

SN74LVC86AQPWREP

LVC86AE

–55

°C to 125°C

SOIC – D

Reel of 2500

SN74LVC86AMDREP

LVC86AM

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI

website at www.ti.com.

(2)

Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.

FUNCTION TABLE

(EACH GATE)

INPUTS

OUTPUT

Y

A

B

L

L

L

L

H

H

H

L

H

H

H

L

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas

Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

PRODUCTION DATA information is current as of publication date.

Copyright © 2003–2007, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.