L9953_V01 datasheet(25/38 Pages) STMICROELECTRONICS

25 / 38 page

L9953 / L9953XP

Functional description of the SPI

Doc ID 14278 Rev 4

25/38

4.9

Test mode

The Test Mode can be entered by rising the CSN input to a voltage higher than 9.5V. In the

test mode the inputs CLK, DI, PWM1/2, the internal 2MHz CLK, OL and OC can be

multiplexed to output DO and Iref, Tsens1-4 and Vbgp can be multiplexed to input

CM/PWM2.

Furthermore the over-current thresholds are reduced by a factor of 4 to allow EWS testing at

lower current.

The internal logic prevents that the High-Side and Low-Side driver of the same half-bridge

can be switched-on at the same time. In the test mode this combination is used to multiplex

the desired signals according to following table:

Table 18.

Test mode

OUT1

PWM

1 EN

OUT2

PWM

1 EN

OUT3

PWM

1 EN

OUT4

PWM

1 EN

OUT5

PWM

1 EN

OUT6

PWM

1 EN

LS3

HS3

LS4

HS4

LS5

HS5

Test Pad

! (both HI)

NoError

! (both HI)

5µA Iref

both HI

! (both HI)

both HI

! (both HI)

Tsens1

! (both HI)

both HI

! (both HI)

CLK

! (both HI)

both HI

! (both HI)

Tsens2

both HI

! (both HI)

INT_CLK

both HI

! (both HI)

Tsens3

! (both HI)

both HI

PWM1

! (both HI)

both HI

Tsens4

both HI

! (both HI)

both HI

PWM2

both HI

! (both HI)

both HI

! (both HI)

both HI

! (both HI)

both HI

Vbandgap

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