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MBR10H100CTG. Datasheet(PDF) 2 Page - ON Semiconductor |
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MBR10H100CTG. Datasheet(HTML) 2 Page - ON Semiconductor |
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2 / 6 page ![]() MBR10H100CT http://onsemi.com 2 MAXIMUM RATINGS (Per Diode Leg) Rating Symbol Value Unit Peak Repetitive Reverse Voltage Working Peak Reverse Voltage DC Blocking Voltage VRRM VRWM VR 100 V Average Rectified Forward Current (Rated VR) TC = 168°C IF(AV) 5.0 A Peak Repetitive Forward Current (Rated VR, Square Wave, 20 kHz) TC = 165°C IFRM 10 A Nonrepetitive Peak Surge Current (Surge applied at rated load conditions halfwave, single phase, 60 Hz) IFSM 180 A Operating Junction Temperature (Note 1) TJ +175 °C Storage Temperature Tstg *65 to +175 °C Voltage Rate of Change (Rated VR) dv/dt 10,000 V/ms Controlled Avalanche Energy (see test conditions in Figures 10 and 11) WAVAL 100 mJ ESD Ratings: Machine Model = C Human Body Model = 3B > 400 > 8000 V THERMAL CHARACTERISTICS Maximum Thermal Resistance − Junction−to−Case − Junction−to−Ambient RqJC RqJA 2.0 60 °C/W ELECTRICAL CHARACTERISTICS (Per Diode Leg) Maximum Instantaneous Forward Voltage (Note 2) (IF = 5.0 A, TC = 25°C) (IF = 5.0 A, TC = 125°C) (IF = 10 A, TC = 25°C) (IF = 10 A, TC = 125°C) vF 0.73 0.61 0.85 0.71 V Maximum Instantaneous Reverse Current (Note 2) (Rated DC Voltage, TC = 125°C) (Rated DC Voltage, TC = 25°C) iR 4.5 0.0035 mA Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 1. The heat generated must be less than the thermal conductivity from Junction−to−Ambient: dPD/dTJ < 1/RqJA. 2. Pulse Test: Pulse Width = 300 ms, Duty Cycle ≤ 2.0%. |
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