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EMIF03-SIM05F3 Datasheet (PDF) - STMicroelectronics

EMIF03-SIM05F3 Datasheet PDF - STMicroelectronics
Part # EMIF03-SIM05F3
Download  EMIF03-SIM05F3 Download
File Size   365.59 Kbytes
Page   9 Pages
Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics
Description EMI filter with SWP protection for SIM interface

EMIF03-SIM05F3 Datasheet (PDF)

Go To PDF Page Download Datasheet
EMIF03-SIM05F3 Datasheet PDF - STMicroelectronics

Part # EMIF03-SIM05F3
Download  EMIF03-SIM05F3 Click to download

File Size   365.59 Kbytes
Page   9 Pages
Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics
Description EMI filter with SWP protection for SIM interface

EMIF03-SIM05F3 Datasheet (HTML) - STMicroelectronics


EMIF03-SIM05F3 Product details

Description
The EMIF03-SIM05F3 is a highly integrated device designed to protect SIM interface and SWP line against ESD transients and EMI emission.
The device is the ideal fit for applications using NFC.

Features
■ Lead-free package
■ Very low PCB space consumption
■ Very thin package: < 0.55 mm after reflow
■ High efficiency in ESD suppression IEC6 1000-4-2 level 4
■ High reliability offered by monolithic integration
■ High reduction of parasitic elements through integration and WLCSP packaging

Application
■ Mobile phones




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About STMicroelectronics


STMicroelectronics is a multinational electronics and semiconductor manufacturer based in Geneva, Switzerland.

The company offers a wide range of products including microcontrollers, sensors, power amplifiers, and integrated circuits for various applications in the automotive, industrial, and consumer markets.

Founded in 1987, STMicroelectronics has operations in over 100 countries and is one of the largest semiconductor companies in the world.

*This information is for general informational purposes only, we will not be liable for any loss or damage caused by the above information.




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