1 Features
• Vendor item drawing available, VID V62/25633-01XE
• Radiation - Total Ionizing Dose (TID):
– TID characterized up to 50krad(Si)
– TID performance assurance up to 30krad(Si)
– Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si)
• Radiation - Single-Event Effects (SEE):
– Single Event Latch-Up (SEL) immune up to 50MeV-cm2/mg at 125°C
– Single Event Transient (SET) characterized up to LET = 50MeV-cm2/mg
• Wide operating range of 1.2V to 5.5V
• Single-supply voltage translator:
– Up translation:
• 1.2V to 1.8V
• 1.5V to 2.5V
• 1.8V to 3.3V
• 3.3V to 5.0V
– Down translation:
• 5.0V, 3.3V, 2.5V to 1.8V
• 5.0V, 3.3V to 2.5V
• 5.0V to 3.3V
• 5.5V tolerant input pins
• Supports standard pinouts
• Up to 150Mbps with 5V or 3.3V VCC
• Latch-up performance exceeds 250mA per JESD 17
• Space enhanced plastic:
– Supports defense and aerospace applications
– Controlled baseline
– Au bondwire and NiPdAu lead finish
– Meets NASA ASTM E595 outgassing specification
– One fabrication, assembly, and test site
– Extended product life cycle
– Product traceability