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M0002947 Datasheet(PDF) 1 Page - National Semiconductor (TI) |
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M0002947 Datasheet(HTML) 1 Page - National Semiconductor (TI) |
1 / 9 page ![]() Original Creation Date: 08/25/95 Last Update Date: 10/05/98 Last Major Revision Date: 03/19/97 MN54ABT646-X REV 0B0 MICROCIRCUIT DATA SHEET OCTAL TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS General Description The ABT646 consists of bus tranceiver circuits wit TRI-STATE, D-type flip-flops, and control circuitry arranged for multiplexed transmission of data directly from the input bus or from the internal registers. Data on the A or B bus will be clocked into the registers as the appropriate clock pin goes to a high logic level. Control OE and direction pins are provided to control the transceiver function. In the transceiver mode, data present at the high impedance port may be stored in either the A or the B register or in both. The select controls can mutiplex stored and real-time (transparent mode) data. The direction control determines which bus will receive data when the enable control OE is Active LOW. In the isolation mode (control OE HIGH), A data may be stored in the B register and/or B data may be stored in the A register. NS Part Numbers 54ABT646E-QML * 54ABT646J-QML ** 54ABT646W-QML *** Industry Part Number 54ABT646 Prime Die NB646 Controlling Document See Features Page Processing MIL-STD-883, Method 5004 Quality Conformance Inspection MIL-STD-883, Method 5005 Subgrp Description Temp ( C) o 1 Static tests at +25 2 Static tests at +125 3 Static tests at -55 4 Dynamic tests at +25 5 Dynamic tests at +125 6 Dynamic tests at -55 7 Functional tests at +25 8A Functional tests at +125 8B Functional tests at -55 9 Switching tests at +25 10 Switching tests at +125 11 Switching tests at -55 1 |
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