AD4000/AD4004/AD4008

Data Sheet

Rev. C | Page 6 of 36

Parameter

Test Conditions/Comments

Min

Typ

Max

Unit

Power Dissipation

10 kSPS, high-Z mode disabled

70

µW

500 kSPS, high-Z mode disabled

3.5

4.2

mW

1 MSPS, high-Z mode disabled

7

8.2

mW

2 MSPS, high-Z mode disabled

14

16

mW

500 kSPS, high-Z mode enabled

4

5

mW

1 MSPS, high-Z mode enabled

8

9.9

mW

2 MSPS, high-Z mode enabled

16

19

mW

VDD Only

500 kSPS, high-Z mode disabled

2.5

mW

1 MSPS, high-Z mode disabled

4.9

mW

2 MSPS, high-Z mode disabled

9.75

mW

REF Only

500 kSPS, high-Z mode disabled

0.9

mW

1 MSPS, high-Z mode disabled

1.9

mW

2 MSPS, high-Z mode disabled

3.75

mW

VIO Only

500 kSPS, high-Z mode disabled

0.1

mW

1 MSPS, high-Z mode disabled

0.2

mW

2 MSPS, high-Z mode disabled

0.5

mW

Energy per Conversion

7

nJ/sample

TEMPERATURE RANGE

Specified Performance

−40

+125

°C

1

The acquisition phase is the time available for the input sampling capacitors to acquire a new input with the ADC running at a throughput rate of 2 MSPS for the

AD4000, 1 MSPS for the AD4004, and 500 kSPS for the AD4008.

2

A throughput rate of 2 MSPS can only be achieved with turbo mode enabled and a minimum SCK rate of 70 MHz. Refer to Table 4 for the maximum achievable

throughput for different modes of operation.

3

Transient response is the time required for the ADC to acquire a full-scale input step to ±0.5 LSB accuracy.

4

The minimum and maximum values are guaranteed by characterization, but not production tested.

5

See the 1/f noise plot in Figure 23.