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TPA3221

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SLASEE9 – JUNE 2017

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Copyright © 2017, Texas Instruments Incorporated

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Stuck at Fault occurs when input OSC_IO input signal frequency drops below minimum frequency given in the Electrical Characteristics

table of this data sheet.

9.4.5.7 Fault Handling

If a fault situation occurs while in operation, the device acts accordingly to the fault being a global or a channel

fault. A global fault is a chip-wide fault situation and causes all PWM activity of the device to be shut down, and

will assert FAULT low. A global fault is a latching fault and clearing FAULT and restarting operation requires

resetting the device by toggling RESET. Deasserting RESET should never be allowed with excessive system

temperature, so it is advised to monitor RESET by a system microcontroller and only allow releasing RESET

(RESET high) if the OTW_CLIP signal is cleared (high). A channel fault results in shutdown of the PWM activity

of the affected channel(s). Note that asserting RESET low forces the FAULT signal high, independent of faults

being present.

Table 6. Error Reporting

Fault/Event

Fault/Event

Description

Global or

Channel

Reporting

Method

Latched/Self

Clearing

Action needed to

Clear

Output

FETs

PVDD_X UVP

Voltage Fault

Global

FAULT pin

Self Clearing

Increase affected

supply voltage

HI-Z

AVDD UVP

POR (AVDD UVP)

Power On Reset

Global

FAULT pin

Self Clearing

Allow AVDD to rise HI-Z

BST_X UVP

Voltage Fault

Channel (Half

Bridge)

None

Self Clearing

Allow BST cap to

recharge (lowside

ON, VDD

≥5 V,

AVDD, GVDD = 5

V)

HighSide

off

OTW

Thermal Warning

Global

OTW pin

Self Clearing

Cool below OTW

threshold

Normal

operation

OTE

Thermal Shutdown Global

FAULT pin

Latched

Toggle RESET

HI-Z

OLP (CB3C>2.6 ms)

OC Shutdown

Channel

FAULT pin

Latched

Toggle RESET

HI-Z

CB3C

OC Limiting

Channel

None

Self Clearing

Reduce signal

level or remove

short

Flip state,

cycle by

cycle at

fs/3

No OSC_IO

activity in Slave

Mode

Global

None

Self Clearing

Resume OSC_IO

activity

HI-Z