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AS4C128M16D2 Datasheet(PDF) 67 Page - Alliance Semiconductor Corporation

Part # AS4C128M16D2
Description  Auto Refresh and Self Refresh
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Manufacturer  ALSC [Alliance Semiconductor Corporation]
Direct Link  https://www.alliancememory.com
Logo ALSC - Alliance Semiconductor Corporation

AS4C128M16D2 Datasheet(HTML) 67 Page - Alliance Semiconductor Corporation

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AS4C128M16D2
Confidential
66
Version
2.0 – Oct/2014
IDD specification parameters and test conditions
(IDD values are for full operating range of Voltage and Temperature, Notes 1 - 6)
Symbol
Conditions
Max
Units
Notes
NOTE 1 IDD specifications are tested after the device is properly initialized
NOTE 2 Input slew rate is specified by AC Parametric Test Condition NOTE
3 IDD parameters are specified with ODT disabled.
NOTE 4 Data bus consists of DQ, DM, DQS, DQS, RDQS, RDQS, LDQS, LDQS, UDQS, and UDQS. IDD values must be met with all combinations of
EMRS bits 10 and 11.
NOTE 5 For DDR2-667/800 testing, tCK in the Conditions should be interpreted as tCK(avg) NOTE 6
Definitions for IDD
LOW
=
Vin <
_ VILAC(max)
HIGH
=
Vin
>_VIHAC(min)
STABLE
=
inputs stable at a HIGH or LOW level
FLOATING
=
inputs at VREF = VDDQ/2
SWITCHING = inputs changing between HIGH and LOW every other clock cycle (once per two clocks) for address and control signals,
and inputs changing between HIGH and LOW every other data transfer (once per clock) for DQ signals not
including masks or strobes.
IDD testing parameters
For purposes of IDD testing, the parameters in the IDD testing parameters table are to be utilized
Speed
DDR2-800
Unit
Bin(CL-tRCD-tRP)
5-5-5
6-6-6
CL(IDD)
5
6
tCK
tRCD(IDD)
12.5
15
ns
tRC(IDD)
57.5
60
ns
tRRD(IDD)-1KB
7.5
7.5
ns
tRRD(IDD)-2KB
10
10
ns
tFAW(IDD)-1KB
35
35
ns
tFAW(IDD)-2KB
45
45
ns
tCK(IDD)
2.5
2.5
ns
tRASmin(IDD)
45
45
ns
tRASmax(IDD)
70000
70000
ns
tRP(IDD)
12.5
15
ns
tRFC(IDD)-2Gb
195
195
ns


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