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S3C2440X Datasheet(PDF) 46 Page - Samsung semiconductor |
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S3C2440X Datasheet(HTML) 46 Page - Samsung semiconductor |
46 / 429 page ![]() 2003.09.25 Preliminary product information describes products that are in development, for which full characterization data and associated errata are not yet available Specifications and information herein are subject to change without notice. S3C2440X RISC MICROPROCESSOR MEMORY CONTROLLER DEC.13, 2002 5-5 nWAIT PIN OPERATION If the WAIT corresponding to each memory bank is enabled, the nOE duration should be prolonged by the external nWAIT pin while the memory bank is active. nWAIT is checked from tacc-1. nOE will be deasserted at the next clock after sampling nWAIT is high. The nWE signal have the same relation with nOE. tRC Tacs Tcos Tacc=4 HCLK ADDR nGCS nOE nWAIT DATA(R) Delayed Sampling nWAIT Figure 5-2. S3C2440X External nWAIT Timing Diagram (Tacc=4) |
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