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PC8477BV-1 Datasheet(PDF) 40 Page - National Semiconductor (TI) |
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PC8477BV-1 Datasheet(HTML) 40 Page - National Semiconductor (TI) |
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40 / 54 page  60 Device Description (Continued) 62 AC ELECTRICAL CHARACTERISTICS 621 AC Test Conditions TA e 0 Cto a70 C VCC e 50V g10% Load Circuit TLF11332 – 14 AC Testing Input Output Waveform TLF11332 – 15 622 Clock Timing Symbol Parameter Min Max Units tCH Clock High Pulse Width 16 ns tCL Clock Low Pulse Width 16 ns tCP24 Clock Period 40 43 ns tICP Internal Clock Period (Table 6-1) tDRP Data Rate Period (Table 6-1) TABLE 6-1 Nominal tICP tDRP Values MFM Data Rate tDRP tICP Value Units 1 Mbs 1000 3 x tCP 125 ns 500 kbs 2000 3 x tCP 125 ns 300 kbs 3333 5 x tCP 208 ns 250 kbs 4000 6 x tCP 250 ns TLF11332 – 16 FIGURE 6-1 Clock Timing 40 |
Similar Part No. - PC8477BV-1 |
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Similar Description - PC8477BV-1 |
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