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TPS22810 Datasheet(PDF) 25 Page - Texas Instruments |
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TPS22810 Datasheet(HTML) 25 Page - Texas Instruments |
25 / 35 page ![]() 25 TPS22810 www.ti.com SLVSDH0B – DECEMBER 2016 – REVISED MAY 2017 Product Folder Links: TPS22810 Submit Documentation Feedback Copyright © 2016–2017, Texas Instruments Incorporated 13 Device and Documentation Support 13.1 Device Support 13.1.1 Developmental Support For the TPS22810 PSpice Transient Model, see TPS22810 PSpice Transient Model 13.2 Documentation Support 13.2.1 Related Documentation For related documentation see the following: • TPS22810 Load Switch Evaluation Module • Selecting a Load Switch to Replace a Discrete Solution • Timing of Load Switches 13.3 Receiving Notification of Documentation Updates To receive notification of documentation updates—including silicon errata—go to the product folder for your device on ti.com. In the upper right-hand corner, click the Alert me button. This registers you to receive a weekly digest of product information that has changed (if any). For change details, check the revision history of any revised document. 13.4 Community Resources The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use. TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers. Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and contact information for technical support. 13.5 Trademarks E2E is a trademark of Texas Instruments. All other trademarks are the property of their respective owners. 13.6 Electrostatic Discharge Caution This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. 13.7 Glossary SLYZ022 — TI Glossary. This glossary lists and explains terms, acronyms, and definitions. |
Similar Part No. - TPS22810_17 |
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Similar Description - TPS22810_17 |
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