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TPS22810

www.ti.com

SLVSDH0B – DECEMBER 2016 – REVISED MAY 2017

Product Folder Links: TPS22810

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13 Device and Documentation Support

13.1 Device Support

13.1.1 Developmental Support

For the TPS22810 PSpice Transient Model, see TPS22810 PSpice Transient Model

13.2 Documentation Support

13.2.1 Related Documentation

For related documentation see the following:

•

TPS22810 Load Switch Evaluation Module

•

Selecting a Load Switch to Replace a Discrete Solution

•

Timing of Load Switches

13.3 Receiving Notification of Documentation Updates

To receive notification of documentation updates—including silicon errata—go to the product folder for your

device on ti.com. In the upper right-hand corner, click the Alert me button. This registers you to receive a weekly

digest of product information that has changed (if any). For change details, check the revision history of any

revised document.

13.4 Community Resources

The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective

contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of

Use.

TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration

among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help

solve problems with fellow engineers.

Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and

contact information for technical support.

13.5 Trademarks

E2E is a trademark of Texas Instruments.

All other trademarks are the property of their respective owners.

13.6 Electrostatic Discharge Caution

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

13.7 Glossary

SLYZ022 — TI Glossary.

This glossary lists and explains terms, acronyms, and definitions.