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LMX2306 Datasheet(PDF) 13 Page - National Semiconductor (TI) |
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LMX2306 Datasheet(HTML) 13 Page - National Semiconductor (TI) |
13 / 19 page ![]() 1.0 Functional Description (Continued) TABLE 6. FastLock Timeout Counter Value Programming Timeout 3 7 11 15 19 23 27 31 35 • 59 63 (# PD Cycles) (Note 8) F11 0 1 0101010 • 01 (4) F12 0 0 1100110 • 11 (8) F13 0 0 0011110 • 11 (16) F14 0 0 0000001 • 11 (32) Note 8: The timeout counter decrements after each phase detector comparison cycle. 1.4 SERIAL DATA INPUT TIMING 1.5 PHASE COMPARATOR AND INTERNAL CHARGE PUMP CHARACTERISTICS DS100127-9 Notes: Parenthesis data indicates programmable reference divider data. Data shifted into register on clock rising edge. Data is shifted in MSB first. TEST CONDITIONS: The Serial Data Input Timing is tested using a symmetrical waveform around VCC/2. The test waveform has an edge rate of 0.6V/ns with amplitudes of 1.84V @ VCC = 2.3V and 4.4V @ VCC = 5.5V. DS100127-10 Notes: Phase difference detection range: −2 π to +2π The Phase Detector Polarity F[6] = HIGH The minimum width pump up and pump down current pulses occur at the ICPo pin when the loop is locked. www.national.com 13 |
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