HI-5046A/883

3

FN8274.0

May 3, 2012

Logic Supply Current

1

+25

-

200

µA

2, 3

-55 to +125

-

300

µA

Reference Supply Current

1

+25

-200

-

µA

2, 3

-55 to +125

-300

-

µA

TABLE 1. D.C. ELECTRICAL PERFORMANCE SPECIFICATIONS (Continued)

Device Tested at: Supply Voltage =

D.C. PARAMETERS

SYMBOL

CONDITIONS

GROUP A

SUBGROUPS

TEMPERATURE

(°C)

MIN

MAX

UNITS

TABLE 2. A.C. ELECTRICAL PERFORMANCE SPECIFICATIONS

Device Tested at: Supply Voltage =

PARAMETERS

SYMBOL

CONDITIONS

GROUP A

SUBGROUPS

TEMPERATURE

(°C)

MIN

MAX

UNITS

Turn “ON” Time

11

-55

-

450

ns

9

+25

-

500

ns

10

+125

-

800

ns

Turn “OFF” Time

11

-55

-

350

ns

9

+25

-

450

ns

10

+125

-

600

ns

TABLE 3. ELECTRICAL PERFORMANCE SPECIFICATIONS (NOTE 1)

Device Characterized at:

PARAMETERS

SYMBOL

CONDITIONS

NOTE

TEMPERATURE

(°C)

MIN

MAX

UNITS

“ON” Resistance Match

(Channel to Channel)

1

+25

-

10

Ω

Address Capacitance

1

+25

-

45

pF

Switch Input Capacitance

1

+25

-

60

pF

Switch Output Capacitance

1

+25

-

60

pF

1

+25

-

60

pF

Drain to Source Capacitance

1

+25

-

10

pF

Off Isolation

1

+25

1

60

dB

Crosstalk

1

+25

1

60

dB

Charge Transfer Error

1

+25

-

30

mV

NOTE:

1. Parameters listed in Table 3 are controlled via design or process parameters and are not directly tested at final production. These parameters are lab

characterized upon initial design release, or upon design changes. These parameters are guaranteed by characterization based upon data from

multiple production runs which reflect lot to lot and within lot variation.

TABLE 4. ELECTRICAL TEST REQUIREMENTS

MIL-STD-883 TEST REQUIREMENTS

SUBGROUPS (Tables 1 and 2)

Interim Electrical Parameters (Pre Burn-in)

1

Final Electrical Test Parameters

1 (Note 2), 2, 3, 9, 10, 11

Group A Test Requirements

1, 2, 3, 9, 10, 11

Groups C & D Endpoints

1

NOTE:

2. PDA applies to Subgroup 1 only.