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SI846X Datasheet(PDF) 18 Page - Silicon Laboratories |
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SI846X Datasheet(HTML) 18 Page - Silicon Laboratories |
18 / 36 page Si8460/61/62/63 18 Rev. 1.5 Table 9. IEC 60747-5-2 Insulation Characteristics for Si84xxxB* Parameter Symbol Test Condition Characteristic Unit Maximum Working Insulation Voltage VIORM 560 V peak Input to Output Test Voltage VPR Method b1 (VIORM x 1.875 = VPR, 100% Production Test, tm =1 sec, Partial Discharge < 5 pC) 1050 V peak Transient Overvoltage VIOTM t = 60 sec 4000 V peak Pollution Degree (DIN VDE 0110, Table 1) 2 Insulation Resistance at TS, VIO =500 V RS >109 *Note: Maintenance of the safety data is ensured by protective circuits. The Si84xx provides a climate classification of 40/125/21. Table 10. IEC Safety Limiting Values1 Parameter Symbol Test Condition Min Typ Max Unit NB SOIC-16 Case Temperature TS — — 150 °C Safety input, output, or supply current IS JA = 105 °C/W (NB SOIC-16), VI =5.5 V, TJ =150 °C, TA =25°C — — 215 mA Device Power Dissipation2 PD — — 415 mW Notes: 1. Maximum value allowed in the event of a failure; also see the thermal derating curve in Figure 2. 2. The Si846x is tested with VDD1 = VDD2 = 5.5 V, TJ = 150 ºC, CL = 15 pF, input a 150 Mbps 50% duty cycle square wave. |
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