ADuCM322i

Data Sheet

Rev. 0 | Page 4 of 23

SPECIFICATIONS

MICROCONTROLLER ELECTRICAL SPECIFICATIONS

AVDD = IOVDD = VDD1 = 2.9 V to 3.6 V (see Figure 12), maximum difference between supplies = 0.3 V, VREF = 2.5 V internal reference,

delays in the sequence are required.

Table 1.

Parameter

Symbol

Min

Typ

Max

Unit

Test Conditions/Comments

ADC BASIC SPECIFICATIONS

Single-ended mode, unless

otherwise stated

ADC Power-Up Time

5

µs

Data Rate

1

MSPS

DC Accuracy1

12

Bits

Resolution1

16

Bits

Number of data bits

Integral Nonlinearity

INL

±1.75

LSB

2.5 V internal reference; 1 LSB =

±1.75

LSB

2.5 V external reference; 1 LSB =

Differential Nonlinearity

DNL

−0.99

±0.75

+1.5

LSB

2.5 V internal reference; 1 LSB =

±0.75

LSB

2.5 V external reference; 1 LSB =

DC Code Distribution

±3

LSB

ADC ENDPOINT ERRORS

Offset Error

±200

µV

Drift1

−3.92

0.3

+1.21

µV/°C

Using 2.5 V external reference

Match

±1

LSB

Matching compared to AIN8

Full-Scale Error

±400

µV

Gain Drift1

−4

+5

µV/°C

Full-scale error drift minus offset

error drift

Match

±1

LSB

ADC DYNAMIC PERFORMANCE

Signal-to-Noise Ratio

SNR

80

dB

Includes distortion and noise

components

Total Harmonic Distortion

THD

−86

dB

Peak Harmonic or Spurious Noise

−88

dB

Channel-to-Channel Crosstalk

−90

dB

Measured on adjacent channels

ADC INPUT

Input Voltage Ranges

Single-Ended Mode1

AGND

VREF

Compliance1

AGND4

AVDD4

Leakage Current

±1.5

nA

Input Current

±9

µA/V

At 1 MSPS

±6

µA/V

≤800 kSPS

±4

µA/V

500 kSPS, ADCCNVC, Bits[25:16] =

0x1E

Input Capacitance

20

pF

During ADC acquisition

ON-CHIP VOLTAGE REFERENCE

2.51

V

0.47 µF from VREF_1V2 to AGND4;

reference is measured with all ADC

and VDACs enabled

Accuracy

±5

mV

Reference Temperature Coefficient1

±15

ppm/°C

Power Supply Rejection Ratio

PSRR

60

dB

50

ms