21500TH(KT)/90196RM/33194HO/8064KI/3233KI/O070KI,TS No.750-1/13

http://onsemi.com

Semiconductor Components Industries, LLC, 2013

July, 2013

ORDERING INFORMATION

See detailed ordering and shipping information on page 13 of this data sheet.

LA4440

Features

Package Dimensions

 Built-in 2 channels (dual) enabling use in stereo and bridge

amplifier applications.

Dual

: 6W

2 (typ)

Bridge : 19W (typ)

 Minimum number of external parts required.

 Small pop noise at the time of power supply ON/OFF and

good starting balance.

 Good ripple rejection : 46dB (typ)

 Good channel separation.

 Small residual noise (Rg=0).

 Low distortion over a wide range from low frequencies to

high frequencies.

 Easy to design radiator fin.

 Built-in audio muting function.

 Built-in protectors.

a. Thermal protector

b. Overvoltage, surge voltage protector

c. Pin-to-pin short protector

Specifications

Absolute Maximum Ratings at Ta = 25

C

Parameter

Symbol

Conditions

Ratings

unit

Maximum supply voltage

VCC max1

Quiescent (t=30s)

25

V

VCC max2

Operating

18

V

Surge supply voltage

VCC (surge)

t ≤ 0.2s

50

V

Allowable power dissipation

Pd max

Tc=75°C, See Pd max – Ta characteristic

15

W

Thermal resistance

j-c

Junction-to-case

3°C/W

Operating temperature

Topr

–20 to +75

C

Storage temperature

Tstg

–40 to +150

C

Recommended Operating Conditions at Ta = 25

C

Parameter

Symbol

Conditions

Ratings

unit

Supply voltage

VCC

13.2

V

Load resistance

RL

Stereo

2 to8



Bridge

4 to 8



Monolithic Linear IC

6W 2-Channel, Bridge 19W(typ)

Power Amplifier

Ordering number : EN750F

Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed,

damage may occur and reliability may be affected.

unit : mm

Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the Recommended

Operating Ranges limits may affect device reliability.