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OM25180FDKM Datasheet(PDF) 65 Page - NXP Semiconductors |
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OM25180FDKM Datasheet(HTML) 65 Page - NXP Semiconductors |
65 / 149 page ![]() PN5180 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2016. All rights reserved. Product data sheet COMPANY PUBLIC Rev. 3.0 — 7 October 2016 240930 65 of 149 NXP Semiconductors PN5180 High-performance multi-protocol full NFC Forum-compliant frontend The PN5180 allows measuring periodically the RX voltage. The RX voltage is used as indicator for the actual antenna current. The voltage measurement is done with the help of the AGC. The time interval between two measurements can be configured with the OC_TIME byte in the EEPROM. Fig 31. AGC value defining the RF output power configuration Fig 32. AGC value defining the waveshape configuration PWR LUT ENTRY 1 DPC_AGC_GEAR_LUT PWR LUT ENTRY 2 PWR LUT ENTRY 3 PWR LUT ENTRY 4 PWR LUT ENTRY 5 PWR LUT ENTRY X GEAR AGC VALUE DPC_THRSH_HIGH DPC_THRISH_LOW aaa-019796 PCD_SHAPING_LUT CONFIGURED PROTOCOL SHAPING LUT ENTRY 1 SHAPING LUT ENTRY 2 SHAPING LUT ENTRY 2 SHAPING LUT ENTRY Z GEAR AGC VALUE aaa-023828 |
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