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OM25180FDKM Datasheet(PDF) 46 Page - NXP Semiconductors |
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OM25180FDKM Datasheet(HTML) 46 Page - NXP Semiconductors |
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46 / 149 page  PN5180 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2016. All rights reserved. Product data sheet COMPANY PUBLIC Rev. 3.0 — 7 October 2016 240930 46 of 149 NXP Semiconductors PN5180 High-performance multi-protocol full NFC Forum-compliant frontend 11.5.3 RAM The RAM is used as Input/Output buffer, and implements independent buffers for input and output. The buffers are able to improve the performance of a system with limited interface speed. 11.5.4 Register Registers configure the PN5180 for a specific RF protocol and other functionality. Registers can be initialized using the host interface or by copying data from EEPROM to the register as done by the command LOAD_RF_CONFIG. It is mandatory to use the command LOAD_RF_CONFIG for selection of a specific RF protocol. 11.6 Debug Signals 11.6.1 General functionality The debugging of the RF functionality of the PN5180 is supported by a configurable test signal output possibility. Up to 2 analog or up to 4 digital test signals can be routed to configurable output pins of the PN5180. Test signals can be either analog or digital signals. The analog test signals contain the digital data of the signal processing unit of the PN5180, converted to analog signals by a DAC to allow the inspection of these signals in real time. Two set commands exist for configuration of the digital and analog debug signal output, SET_DIGITAL_TESTOUT and SET_ANALOG_TESTOUT. 11.6.2 Digital Debug Configuration The digital debug output is configured by the command SET_DIGITAL_TESTOUT. Two parameters are passed within this command. The first parameter (1 byte) defines the test signal group. Out of this test signal group, one signal can be selected for output on a pin of the PN5180 (4 bits). The signal of the test signal group is selected by the low-nibble of parameter 2. A value of 8 on this position selects the 13.56 MHz clock to be put out on the selected pin. The high nibble of parameter 2 (1 byte) selects the output pin for the selected test signal. The following parameter groups are possible: Table 42. Debug Signal Group Selection Command parameter (hex) Debug Signal Group 01 Clock signal group 1B Transmitter encoder group 1D Timer group 30 Card mode protocol group 58 Transceive group 70 Receiver data transfer group 73 Receiver error group |
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