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SCC68681 Datasheet(PDF) 21 Page - NXP Semiconductors |
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SCC68681 Datasheet(HTML) 21 Page - NXP Semiconductors |
21 / 29 page ![]() Philips Semiconductors Product data SCC68681 Dual asynchronous receiver/transmitter (DUART) 2004 Apr 06 21 AC CHARACTERISTICS 1, 2, 3, 4 Tamb = –40 °C to +85 °C; VCC = 5.0 V ± 10% SYMBOL PARAMETER LIMITS UNIT SYMBOL PARAMETER Min Typ3 Max UNIT Reset Timing (See Figure 3) tRES RESETN pulse width 200 ns Bus Timing (See Figures 4, 5, 6) tAS A1–A4 setup time to CSN LOW 10 – – ns tAH A1–A4 hold time from CSN LOW 100 – – ns tRWS RWN setup time to CSN HIGH 0 – – ns tRWH RWN hold time to CSN HIGH 0 – – ns tCSW CSN HIGH pulse width 90 – – ns tCSD5 CSN or IACKN HIGH from DTACKN LOW 20 – – ns tDD Data valid from CSN or IACKN LOW – – 175 ns tDF Data bus floating from CSN or IACKN HIGH7 – – 100 ns tDS Data setup time to CLK HIGH 100 – – ns tDH Data hold time from CSN HIGH 20 – – ns tDAL DTACKN LOW from read data valid 0 – – ns tDCR DTACKN LOW (read cycle) from CLK HIGH – – 125 ns tDCW DTACKN LOW (write cycle) from CLK HIGH – – 125 ns tDAH DTACKN HIGH from CSN or IACKN HIGH – – 100 ns tDAT DTACKN HIGH impedance from CSN or IACKN HIGH – – 125 ns tCSC6 CSN or IACKN setup time to clock HIGH 90 – – ns Port Timing (See Figure 7) tPS Port input setup time to CSN LOW 0 – – ns tPH Port input hold time from CSN HIGH 0 – – ns tPD Port output valid from CSN HIGH – – 400 ns Interrupt Reset Timing (See Figure 9) INTRN or OP3–OP7 when used as interrupts negated from: Read RHR (RxRDY/FFULL interrupt) – – 300 ns Write THR (TxRDY interrupt) – – 300 ns tIR Reset command (delta break interrupt) – – 300 ns IR Stop C/T command (counter interrupt) – – 300 ns Read IPCR (input port change interrupt) – – 300 ns Write IMR (clear of interrupt mask bit) – – 300 ns Clock Timing (See Figure 8) tCLK X1/CLK HIGH or LOW time 100 – – ns fCLK8 X1/CLK frequency 0 3.6864 4.0 MHz tCTC CTCLK HIGH or LOW time 100 – – ns fCTC CTCLK frequency 0 – 4.0 MHz tRX RxC HIGH or LOW time 220 – – ns fRX RxC frequency (16 ×) 0 – 2.0 MHz RX (1 ×) 0 – 1.0 MHz tTX TxC HIGH or LOW time 220 – – ns fTX TxC frequency (16 ×) 0 – 2.0 MHz TX (1 ×) 0 – 1.0 MHz Transmitter Timing (See Figure 10) tTXD TxD output delay from TxC external clock input on IP pin – – 350 ns tTCS Output delay from TxC LOW at OP pin to TxD data output – – 150 ns Receiver Timing (See Figure 11) tRXS RxD data setup time before RxC HIGH at external clock input on IP pin 240 – – ns tRXH RxD data hold time after RxC HIGH at external clock input on IP pin 200 – – ns NOTES: 1. Parameters are valid over specified temperature range. See Ordering information table for applicable operating temperature and VCC supply range. 2. All voltage measurements are referenced to ground (GND). For testing, all inputs except X1/CLK swing between 0.4 V and 2.4 V with a transition time of 20 ns maximum. For X1/CLK this swing is between 0.4 V and 4.4 V. All time measurements are referenced at input voltages of 0.8 V and 2.0 V as appropriate. 3. Typical values are at +25 °C, typical supply voltages, and typical processing parameters. 4. Test conditions for outputs: CL = 150 pF, except interrupt outputs. Test condition for interrupt outputs: CL = 50 pF, RL = 2.7 kΩ to VCC. 5. This specification will impose maximum 68000 CPU CLK to 6MHz. Higher CPU CLK can be used if repeating bus reads are not performed. Consecutive write operations to the same command register require at least three edges of the X1 clock between writes. 6. This specification imposes a lower bound on CSN and IACKN LOW, guaranteeing that it will be LOW for at least 1 CLK period. This requirement is made on CSN only to insure assertion of DTACKN and not to guarantee operation of the part. 7. This spec is made only to insure that DTACKN is asserted with respect to the rising edge of the X1/CLK pin as shown in the timing diagram, not to guarantee operation of the part. If setup time is violated, DTACKN may be asserted as shown, or may be asserted 1 clock cycle later. 8. Operation to 0 MHz is assured by design. Minimum test frequency is 2.0 MHz. |
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