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LM57-Q1 Datasheet(PDF) 12 Page - Texas Instruments |
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LM57-Q1 Datasheet(HTML) 12 Page - Texas Instruments |
12 / 38 page ![]() LM57 VTEMP GND TRIP TEST TOVER TEMP SENSOR (negative temp coefficient) + - VDD TOVER VDD = 2.4V to 5.5V TRIP TEST = 1 TRIP TEST = 0 SENSE1 SENSE2 DAC GAIN VTRIP LM57-Q1 SNIS191A – JULY 2015 – REVISED JULY 2015 www.ti.com 7 Detailed Description 7.1 Overview The LM57-Q1 is a precision, dual-output, temperature switch with analog temperature sensor output. The trip temperature (TTRIP) is selected from 256 possible values by using two external 1% resistors. The VTEMP class AB analog output provides a voltage that is proportional to temperature. The LM57-Q1 includes an internal reference DAC, analog temperature sensor and analog comparator. The reference DAC is connected to one of the comparator inputs. The reference DAC output voltage (VTRIP) is controlled by the value of resistance applied to the SENSE pins. The resistance value sets one of 16 "logic" levels at the SENSE pins. These "logic" levels are then decoded and applied to the DAC input, thus the actual resistance tolerance does not directly affect the threshold level accuracy. The result of the reference DAC voltage and the temperature sensor output comparison is provided on two output pins TOVER and TOVER. The VTEMP output has a programmable gain. The output gain has 4 possible settings as described in Figure 12. The gain setting is dependent on the trip point selected by resistance applied to the SENSE pins. Built-in temperature hysteresis (THYST) prevents the digital outputs from oscillating. The TOVER and TOVER will activate when the die temperature exceeds TTRIP and will release when the temperature falls below a temperature equal to TTRIP minus THYST. TOVER is active-high with a push-pull structure. TOVER , is active-low with an open-drain structure. There are two different hysteresis options available that are factory preset. The preset hysteresis can be selected by purchasing the proper order number as described in Device Comparison Table . Driving the TRIP-TEST high will activate the digital outputs. A processor can check the logic level of the TOVER or TOVER , confirming that they changed to their active state. This allows for system production testing verification that the comparator and output circuitry are functional after system assembly. When the TRIP-TEST pin is high, the trip-level reference voltage appears at the VTEMP pin. Tying TOVER to TRIP-TEST will latch the output after it trips. It can be cleared by forcing TRIP-TEST low or powering off the LM57-Q1. 7.2 Functional Block Diagram 12 Submit Documentation Feedback Copyright © 2015, Texas Instruments Incorporated Product Folder Links: LM57-Q1 |
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