0

500

1,000

1,500

2,000

2,500

3,000

3,500

-50

-25

0

25

50

75

100

125

150

175

TEMPERTURE (

SC)

J2 (-5.166mV/°C)

J3 (-7.752mV/°C)

J4 (-10.339mV/°C)

J5 (-12.924mV/°C)

C101

(+2.4V to +5.5V)

GND

TRIP TEST

Microcontroller

LM57

ADC Input

Digital In

Digital Out

SENSE1

SENSE2

Analog

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LM57-Q1

SNIS191A – JULY 2015 – REVISED JULY 2015

LM57-Q1 Resistor-Programmable Temperature Switch and Analog Temperature Sensor

1 Features

3 Description

The LM57-Q1 device is a precision, dual-output,

1

•

Qualified for Automotive Applications, for

temperature switch with analog temperature sensor

Commercial Device See LM57 Data Sheet

output for wide temperature applications such as

•

AEC-Q100 Qualified with the Following Results:

–

Temperature Grade 0 Extended:

−50°C to

selected from 256 possible values in the range of

+160°C with Excursions up to 170°C Operating

voltage output that is proportional to temperature with

Temperature Range

a programmable negative temperature coefficient

–

Temperature Grade 0:

−50°C to +150°C

Operating Temperature Range

–

Temperature Grade 1:

−50°C to +125°C

protection and monitoring of system thermal events.

Operating Temperature Range

–

HBM ESD Component Classification Level 2

outputs will assert when the die temperature exceeds

–

CDM ESD Component Classification Level C5

•

Trip Temperature Set by External Resistors with

Accuracy of ±2.3°C from

−40°C to +150°C

•

Resistor Tolerance Contributes Zero Error

is active-low with an open-drain structure. Tying

•

Push-Pull and Open-Drain Switch Outputs

•

Wide Operating Temperature Range of

−50°C to

The output can be cleared by forcing TRIP-TEST low.

160°C

Driving the TRIP-TEST high will assert the digital

•

with ±1.3°C Accuracy from

−50°C to +150°C

This allows for in situ verification that the comparator

•

Short-Circuit Protected Analog and Digital Outputs

and output circuitry are functional after system

•

Latching Function for Digital Outputs

assembly. When TRIP-TEST is high, the trip-level

•

TRIP-TEST Pin Allows In-System Testing

system could then use this voltage to calculate the

•

Low Power Minimizes Self-Heating to Under

threshold of the LM57-Q1.

0.02°C

Device Information (1) (2)

2 Applications

PART NUMBER

PACKAGE

BODY SIZE (NOM)

•

Automotive

LM57 -Q1

TSSOP (8)

3.00 mm × 6.40 mm

•

Down Hole and Avionics

(1) For all available packages, see the orderable addendum at

the end of the data sheet.

(2) For device comparison see Device Comparison Table .

LM57-Q1 Overtemperature Alarm

Temperature Transfer Function

1

An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,

intellectual property matters and other important disclaimers. PRODUCTION DATA.