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LM57-Q1 Datasheet(PDF) 25 Page - Texas Instruments |
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LM57-Q1 Datasheet(HTML) 25 Page - Texas Instruments |
25 / 38 page ![]() LM57 TRIP TEST GND TOVER VDD RESET Momentary 100k TOVER LM57-Q1 www.ti.com SNIS191A – JULY 2015 – REVISED JULY 2015 Device Functional Modes (continued) The TRIP TEST pin, normally used to check the operation of the TOVER and TOVER pins, may be used to latch the outputs whenever the temperature exceeds the programmed limit and causes the digital outputs to assert. As shown in Figure 19, when TOVER goes high, the TRIP TEST input is also pulled high and causes TOVER output to latch high and the TOVER output to latch low. Momentarily switching the TRIP TEST input low will reset the LM57- Q1 to normal operation. The resistor limits the current out of the TOVER output pin. Figure 19. Latch Circuit Using TOVER Output Copyright © 2015, Texas Instruments Incorporated Submit Documentation Feedback 25 Product Folder Links: LM57-Q1 |
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