LM57-Q1 datasheet(23/38 Pages) TI1

Part #	LM57-Q1

Description	Resistor-Programmable Temperature Switch and Analog Temperature Sensor

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LM57

TOVER

VDD

Asserts when TDIE > TTRIP

See text

GND

TRIP TEST

SENSE1

SENSE2

VTEMP

LM57

VDD

GND

CLOAD @ 1100 pF

RS

VTEMP

LM57

VDD

GND

CLOAD > 1100 pF

LM57-Q1

www.ti.com

SNIS191A – JULY 2015 – REVISED JULY 2015

7.3.6.2 VTEMP Capacitive Loads

The VTEMP Output handles capacitive loading well. In an extremely noisy environment, or when driving a switched

sampling input on an ADC, it may be necessary to add some filtering to minimize noise coupling. Without any

precautions, the VTEMP can drive a capacitive load less than or equal to 1100 pF as shown in Figure 13. For

capacitive loads greater than 1100 pF, a series resistor is required on the output, as shown in Figure 14, to

maintain stable conditions.

Figure 13. LM57-Q1 With No Isolation Resistor

Figure 14. LM57-Q1 With Series Resistor for

Required

Capacitive Loading Greater than 1100 pF

Table 6. CLOAD and RS Values of Figure 14

CLOAD

Minimum RS

1.1 to 99 nF

3 k

Ω

100 to 999 nF

1.5 k

Ω

1

μF

750

Ω

7.3.6.3 VTEMP Voltage Shift

The LM57-Q1 is very linear over temperature and supply voltage range. Due to the intrinsic behavior of an

NMOS/PMOS rail-to-rail buffer, a slight shift in the output can occur when the supply voltage is ramped over the

operating range of the device. The location of the shift is determined by the relative levels of VDD and VTEMP. The

shift typically occurs when VDD − VTEMP = 1 V.

This slight shift (a few millivolts) takes place over a wide change (approximately 200 mV) in VDD or VTEMP. Since

the shift takes place over a wide temperature change of 5°C to 20°C, VTEMP is always monotonic. The accuracy

specifications in the Electrical Characteristics table already includes this possible shift.

7.4 Device Functional Modes

The LM57-Q1 has several modes of operation as detailed in the following drawings.

Figure 15. Temperature Switch Using Push-Pull Output

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