www.ti.com

DESCRIPTION (Continued)

PACKAGE DISSIPATION RATINGS

ABSOLUTE MAXIMUM RATINGS

bq29312A

SLUS629A – JANUARY 2005 – REVISED AUGUST 2005

These devices have limited built-in ESD protection. The leads should be shorted together or the device

placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates.

The communications interface allows the host to observe and control the current status of the bq29312A. It

enables cell balancing, enters different power modes, sets overload levels, sets the overload blanking delay time,

sets short-circuit threshold levels for charge and discharge, and sets the short-circuit blanking delay time.

Cell balancing of each cell is performed via a cell bypass path, which is enabled via the internal control register

and internal FET on resistance (typical 400

Ω).

PACKAGED

–40°C to 85°C

bq29312APWR-SA

bq29312ARTH

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI

website at www.ti.com.

(2)

The bq29312A can be ordered in tape and reel by adding the suffix R to the orderable part number, ie: bq29312APWR bq29312ARTHR.

(3)

The QFN package is also made available in mini reel, add suffix T to the orderable part number, ie: bq29312ARTHT.

POWER RATING

POWER RATING

DERATING FACTOR

PACKAGE

PW

874 mW

6.99 W/°C

559 mW

454 mW

bq29312A

Supply voltage range

PACK, BAT

–0.3 V to 34 V

VC1, VC2, VC3, VC4

–0.3 V to 34 V

SR1, SR2

–1.0 V to 1.0 V

VC5

–1.0 V to 4.0 V

Input voltage range

VC1 to VC2, VC2 to VC3, VC3 to VC4, VC4 to

–0.3 to 8.5 V

VC5

WDI, SLEEP, SCLK, SDATA

–0.3 to 8.5 V

ZVCHG

–0.3 V to 34 V

DSG, CHG

–0.3 V to BAT

OD

–0.3 V to 34 V

Output voltage range

PMS

–0.3 V to PACK–0.2 V

TOUT, SCLK, SDATA, CELL, XALERT

–0.3 to 7 V

Current for cell balancing

10 mA

Continuous total power dissipation

See Dissipation Rating Table

Storage temperature range

–65°C to 150°C

Lead temperature (soldering, 10 s)

300°C

(1)

Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating

conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

All voltages are with respect to ground of this device except VCn–VC(n+1), where n = 1-, 2-, 3-, 4-cell voltage.

2