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REF1925AIDDCR Datasheet(PDF) 12 Page - Texas Instruments

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Part # REF1925AIDDCR
Description  Voltage References
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

REF1925AIDDCR Datasheet(HTML) 12 Page - Texas Instruments

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0
10
20
30
40
50
-0.0125
-0.01
-0.0075 -0.005 -0.0025
0
0.0025
Solder Heat Shift Histogram - V
REF (%)
C041
0
10
20
30
40
50
60
-0.0125
-0.01
-0.0075 -0.005 -0.0025
0
0.0025
Solder Heat Shift Histogram - V
BIAS (%)
C040
0
50
100
150
200
250
300
0
50
100
150
200
250
300
350
400
Time (seconds)
C01
REF1925, REF1930, REF1933, REF1941
SBOS697 – SEPTEMBER 2014
www.ti.com
8 Parameter Measurement Information
8.1 Solder Heat Shift
The materials used in the manufacture of the REF19xx have differing coefficients of thermal expansion, resulting
in stress on the device die when the device is heated. Mechanical and thermal stress on the device die can
cause the output voltages to shift, degrading the initial accuracy specifications of the product. Reflow soldering is
a common cause of this error.
In order to illustrate this effect, a total of 92 devices were soldered on four printed circuit boards [23 devices on
each printed circuit board (PCB)] using lead-free solder paste and the paste manufacturer suggested reflow
profile. The reflow profile is as shown in Figure 36. The PCB is comprised of FR4 material. The board thickness
is 1.57 mm and the area is 171.54 mm × 165.1 mm.
Figure 36. Reflow Profile
The reference and bias output voltages are measured before and after the reflow process; the typical shift is
displayed in Figure 37 and Figure 38. Although all tested units exhibit very low shifts (< 0.01%), higher shifts are
also possible depending on the size, thickness, and material of the PCB. An important note is that the histograms
display the typical shift for exposure to a single reflow profile. Exposure to multiple reflows, which is common on
PCBs with surface-mount components on both sides, causes additional shifts in the output bias voltage. If the
PCB is exposed to multiple reflows, solder the device in the second pass to minimize device exposure to thermal
stress.
Figure 38. Solder Heat Shift Distribution, VBIAS (%)
Figure 37. Solder Heat Shift Distribution, VREF (%)
12
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Copyright © 2014, Texas Instruments Incorporated
Product Folder Links: REF1925 REF1930 REF1933 REF1941


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