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INA138-Q1 Datasheet(PDF) 2 Page - Texas Instruments |
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INA138-Q1 Datasheet(HTML) 2 Page - Texas Instruments |
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2 / 22 page  INA138-Q1, INA168-Q1 SGLS174G – SEPTEMBER 2003 – REVISED JANUARY 2013 www.ti.com ORDERING INFORMATION(1) SPECIFIED PACKAGE PACKAGE TRANSPORT PRODUCT PACKAGE −LEAD TEMPERATURE DESIGNATOR(2) MARKING MEDIA, QUANTITY RANGE INA138QPWRQ1 TSSOP −8 PW −40°C to 125°C INA138 Tape and reel, 2000 INA168QPWRQ1 TSSOP −8 PW −40°C to 125°C INA168 Tape and reel, 2000 INA168QDBVRQ1 SOT23-5 DBV −40°C to 125°C LUIQ Tape and reel, 3000 (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI Web site at www.ti.com. (2) Package drawings, thermal data, and symbolization are available at www.ti.com/packaging. This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. ABSOLUTE MAXIMUM RATINGS (1) over operating free-air temperature range (unless otherwise noted) VALUE Supply voltage, V+ INA138-Q1 −0.3 V to 60 V INA168-Q1 −0.3 V to 75 V Analog inputs, VIN+, VIN− , common-mode INA138-Q1 −0.3 V to 60 V INA168-Q1 −0.3 V to 75 V Analog inputs, (VIN+) − (VIN−), differential −40 V to 2 V Analog output, out −0.3 V to 40 V Operating temperature −55°C to 150°C Storage temperature −65°C to 150°C Junction temperature 150°C Thermal resistance, junction-to-ambient, RΘJA PW 150°C/W DBV 200°C/W (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. ELECTRICAL CHARACTERISTICS TA = −40°C to 125°C, VS = 5 V, VIN+ = 12 V, and ROUT = 125 kΩ unless otherwise noted PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Input Full-scale sense voltage VSENSE = VIN+ – VIN− 100 500 mV Common-mode input range INA138-Q1 2.7 36 V INA168-Q1 2.7 60 Common-mode rejection VIN+ = 2.7 V to 36 V, VSENSE INA138-Q1 100 120 = 50 mV dB VIN+ = 2.7 V to 60 V, VSENSE INA168-Q1 100 120 = 50 mV Offset voltage(1) ±0.2 ±2 mV Offset voltage versus temperature 1 μV/°C Offset voltage versus power supply, V+ = 2.7 V to 36 V, VSENSE = INA138-Q1 0.1 10 V+ 50 mV μV/V V+ = 2.7 V to 60 V, VSENSE = INA168-Q1 0.1 10 50 mV Input bias current VIN+ = VIN− = 12 V 10 μA (1) Defined as the amount of input voltage, VSENSE, to drive the output to zero. 2 Submit Documentation Feedback Copyright © 2003–2013, Texas Instruments Incorporated Product Folder Links: INA138-Q1 INA168-Q1 |
Similar Part No. - INA138-Q1_15 |
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Similar Description - INA138-Q1_15 |
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