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NOA1305CUTAG Datasheet(PDF) 3 Page - ON Semiconductor

Part # NOA1305CUTAG
Description  Ambient Light Sensor
Download  13 Pages
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Manufacturer  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

NOA1305CUTAG Datasheet(HTML) 3 Page - ON Semiconductor

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NOA1305
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Table 3. OPERATING RANGES
Rating
Symbol
Standard Mode
Fast Mode
Unit
Min
Max
Min
Max
Power supply voltage
VDD
2.4
3.6
2.4
3.6
V
Power supply current
IDD
120
120
mA
Quiescent supply current (Note 3)
IDD_qe
2.0
2.0
mA
Low level input voltage (VDD related input levels)
VIL
−0.5
0.3 VDD
−0.5
0.3 VDD
V
High level input voltage (VDD related input levels) (Note 4)
VIH
0.7 VDD
VDD + 0.5
0.7 VDD
VDD + 0.5
V
Hysteresis of Schmitt trigger inputs (VDD > 2 V)
Vhys
N/A
N/A
0.05 VDD
V
Low level output voltage (open drain) at 3 mA sink current
(VDD > 2 V)
VOL
0
0.4
0
0.4
V
Output low current (VOl=0.4 V)
IOL
3
N/A
3
N/A
mA
Output low current (VOl=0.6 V)
IOL
N/A
N/A
6
N/A
mA
Output fall time from VIHmin to VILmax with a bus capacit-
ance, Cb from 10 pF to 400 pF (Note 4)
tof
250
20+0.1Cb
250
ns
Pulse width of spikes which must be suppressed by the
input filter
tSP
N/A
N/A
0
50
ns
Input current of IO pin with an input voltage between 0.1
VDD and 0.9 VDD
II
−10
10
−10
10
mA
Capacitance on IO pin
CI
10
10
pF
Operating free−air temperature range
TA
−40
85
−40
85
°C
3. Current dissipation when a software Power Down command is sent to the device.
4. Cb = capacitance of one bus line, maximum value of which including all parasitic capacitances should be less than 400 pF.
Table 4. ELECTRICAL CHARACTERISTICS
(Unless otherwise specified, these specifications apply over VDD = 3.3 V, −40°C < TA < 85°C) (Note 5)
Parameter
Symbol
Standard Mode
Fast Mode
Unit
Min
Max
Min
Max
SCL clock frequency
fSCL
0
100
0
400
kHz
Hold time for START condition. After this period, the first
clock pulse is generated.
tHD;STA
4.0
0.6
mS
Low period of SCL clock
tLOW
4.7
1.3
mS
High period of SCL clock
tHIGH
4.0
0.6
mS
Set−up time for a repeated START condition
tSU;STA
4.7
0.6
mS
Data hold time for I2C−bus devices
tHD;DAT_d
0
3.45
0
0.9
mS
Data set−up time
tSU;DAT
250
100
nS
Rise time of both SDA and SCL (Note 6)
tr
1000
20 + 0.1Cb
300
nS
Fall time of both SDA and SCL (Note 6)
tf
300
20 + 0.1Cb
300
nS
Set−up time for STOP condition
tSU;STO
4.0
0.6
mS
Bus free time between STOP and START condition
tBUF
4.7
1.3
mS
Capacitive load for each bus line
Cb
400
400
pF
Noise margin at the low level for each connected device
(including hysteresis)
VnL
0.1 VDD
0.1 VDD
V
Noise margin at the high level for each connected device
(including hysteresis)
VnH
0.2 VDD
0.2 VDD
V
Parameter
Symbol
Typ
Typ
Unit
Internal Oscillator Frequency
fosc
1
1
MHz
5. Refer to Figure 3 for more information on AC characteristics
6. The rise time and fall time are measured with a pull−up resistor Rp = 1 kW and Cb of 400 pF (including all parasitic capacitances).


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