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NOA1305CUTAG Datasheet(PDF) 2 Page - ON Semiconductor

Part # NOA1305CUTAG
Description  Ambient Light Sensor
Download  13 Pages
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Manufacturer  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

NOA1305CUTAG Datasheet(HTML) 2 Page - ON Semiconductor

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NOA1305
http://onsemi.com
2
Figure 1. Typical Application Circuit
SDA
SCL
VDD
VSS
R1
1k
R2
1k
Vin = 2.0 to 3.6 V
IC1
NOA1305
MCU
SDA
SCL
all parasitic capacitances
INT
R3
1k
INT
5
3
4
6
1
C1
10 m
hn
C2
10 m
Cb not to exceed 400 pF including
Figure 2. Simplified Block Diagram
Photo
Diode
Reference
Diode
ADC
SDA
SCL
INT
Osc
I2C Interface
&
Control
ADC
&
Control
I2C Interface
hn
Table 1. PIN FUNCTION DESCRIPTION
Pin
Pin Name
Description
1
VSS
Ground pin.
2
NC
No connection.
3
SCL
External I2C clock supplied by the I2C master. Requires a 1 kW pull−up resistor.
4
SDA
Bi−directional data signal for communications between this device and the I2C master. Requires a 1 kW
pull−up resistor.
5
INT
Interrupt request to the host. Programmable active state, open−drain output and requires an external
1kW pull−up resistor.
6
VDD
Power pin.
Table 2. ABSOLUTE MAXIMUM RATINGS
Rating
Symbol
Value
Unit
Input power supply
VDD
4.0
V
Input voltage range
Vin
−0.3 to VDD + 0.2
V
Output voltage range
Vout
−0.3 to VDD + 0.2
V
Maximum Junction Temperature
TJ(max)
85
°C
Storage Temperature
TSTG
−40 to 85
°C
ESD Capability, Human Body Model (Note 1)
ESDHBM
2
kV
ESD Capability, Charged Device Model (Note 1)
ESDCDM
750 (corner pins), 500 (center pins)
V
ESD Capability, Machine Model (Note 1)
ESDMM
200
V
Moisture Sensitivity Level
MSL
5
Lead Temperature Soldering (Note 2)
TSLD
260
°C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. This device incorporates ESD protection and is tested by the following methods:
ESD Human Body Model tested per EIA/JESD22−A114
ESD Charged Device Model tested per ESD−STM5.3.1−1999
ESD Machine Model tested per EIA/JESD22−A115
Latchup Current Maximum Rating: ≤ 100 mA per JEDEC standard: JESD78
2. For information, please refer to our Soldering and Mounting Techniques Reference Manual, SOLDERRM/D


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