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LC88FC2H0B Datasheet(PDF) 17 Page - ON Semiconductor |
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LC88FC2H0B Datasheet(HTML) 17 Page - ON Semiconductor |
17 / 47 page ![]() LC88FC2H0B www.onsemi.com 17 Continued from preceding page. Parameter Symbol Applicable Pin /Remarks Conditions Specification VDD [V] min typ max unit Peak output current IOPL (1) Ports 0, 1, 3, 4 Ports 7, D P20, P21, P24 to P27 PA0 to PA4, PA6, PA7 PB0 to PB4, PB6, Per applicable pin 15 mA IOPL (2) P22, P23 PA4, PA5 PB4, PB5 Per applicable pin 20 IOPL (3) Ports 5, 6 PC0 to PC4 Per applicable pin 7.5 Average output current (Note 1-1) IOML (1) Ports 0, 1, 3, 4 Ports 7, D P20, P21, P24 to P27 PA0 to PA4, PA6, PA7 PB0 to PB4, PB6, PB7 Per applicable pin 12.5 IOML (2) P22, P23 PA4, PA5 PB4, PB5 Per applicable pin 15 IOML (3) Ports 5, 6 PC0 to PC4 Per applicable pin 5 Total output current IOAL (1) Ports 5 PC0 to PC2 Total of currents at applicable pins 10 IOAL (2) Port 6 PC3 to PC4 Total of currents at applicable pins 10 IOAL (3) Port 5, 6 PC0 to PC4 Total of currents at applicable pins 20 IOAL (4) Ports 1, D P20, P21 Total of currents at applicable pins 35 IOAL (5) P22 to P27 Total of currents at applicable pins 35 IOAL (6) Ports 1, 2, D Total of currents at applicable pins 70 IOAL (7) Port 4 Total of currents at applicable pins 35 IOAL (8) Port 0, 3 Total of currents at applicable pins 35 IOAL (9) Port 0, 3, 4 Total of currents at applicable pins 70 IOAL (10) Port 7, B Total of currents at applicable pins 35 IOAL (11) Port A Total of currents at applicable pins 35 IOAL (12) Port 7, A, B Total of currents at applicable pins 70 Allowable power dissipation Pd max TQFP100 Ta= 40 to +85C Package with thermal resistance bord (Note 1-2) 460 mW Operating ambient temperature Topr 40 +85 C Storage ambient temperature Tstg 55 +125 Note 1-1 : Average output current refers to the average of output currents measured for a period of 100 ms. Note 1-2 : SEMI standerds thermal resistance board (size : 76.1 114.3 1.6 tmm, glass epoxy) is used. Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. |
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