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TPS61222-EP Datasheet(PDF) 4 Page - Texas Instruments |
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TPS61222-EP Datasheet(HTML) 4 Page - Texas Instruments |
4 / 20 page ![]() 1.00 10.00 100.00 1000.00 10000.00 80 90 100 110 120 130 140 150 160 Continuous T (°C) J Electromigration Failure Mode Wirebond Voiding Fail Mode TPS61222-EP SLVSBI2 – SEPTEMBER 2012 www.ti.com (1) See data sheet for absolute maximum and minimum recommended operating conditions. (2) Silicon operating life design goal is 10 years at 105°C junction temperature (does not include package interconnect life). (3) Enhanced plastic product disclaimer applies. Figure 1. TPS61222-EP Operating Life Derating Chart 4 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Links :TPS61222-EP |
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